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A Well Dressed Microscope: Practical Experience with Microcalorimeter and Silicon Drift Detector Systems

Published online by Cambridge University Press:  01 August 2002

John A. Small ,
Dale E. Newbury ,
John Henry J. Scott ,
Lance King ,
Sae Woo Nam ,
Kent Irwin ,
Steve Deiker ,
Shaul Barkan  and
Jan Iwanczyk
John A. Small
Affiliation:
Surface & Microanalysis Science Division, NIST, Gaithersburg, MD 20899
Dale E. Newbury
Affiliation:
Surface & Microanalysis Science Division, NIST, Gaithersburg, MD 20899
John Henry J. Scott
Affiliation:
Surface & Microanalysis Science Division, NIST, Gaithersburg, MD 20899
Lance King
Affiliation:
Surface & Microanalysis Science Division, NIST, Gaithersburg, MD 20899
Sae Woo Nam
Affiliation:
NIST, EEEL, Boulder, CO 230940
Kent Irwin
Affiliation:
NIST, EEEL, Boulder, CO 230940
Steve Deiker
Affiliation:
NIST, EEEL, Boulder, CO 230940
Shaul Barkan
Affiliation:
Photon Imaging Inc., Northridge, CA 91324
Jan Iwanczyk
Affiliation:
Photon Imaging Inc., Northridge, CA 91324

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 8 , Issue S02 , August 2002 , pp. 82 - 83
Copyright
Copyright © Microscopy Society of America 2002