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Monochromized 200kV (S)TEM

Published online by Cambridge University Press:  01 November 2002

P.C. Tiemeijer
Affiliation:
FEI Electron Optics, P O Box 80066, 5600 KA Eindhoven, The Netherlands
J.H.A van Lin
Affiliation:
FEI Electron Optics, P O Box 80066, 5600 KA Eindhoven, The Netherlands
B.H. Freitag
Affiliation:
FEI Electron Optics, P O Box 80066, 5600 KA Eindhoven, The Netherlands
A.F. de Jong
Affiliation:
FEI Electron Optics, P O Box 80066, 5600 KA Eindhoven, The Netherlands

Abstract

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Abstract
Copyright
Copyright © Microscopy Society of America 2002