Hostname: page-component-586b7cd67f-dlnhk Total loading time: 0 Render date: 2024-11-26T08:33:20.915Z Has data issue: false hasContentIssue false
  • English
  • Français

The collection of electron diffraction intensity data and their use in structure determination

Published online by Cambridge University Press:  01 August 2002

J. Gjonnes ,
V. Hansen  and
X.Z. Li
J. Gjonnes
Affiliation:
Center for Materials Science, University of Oslo, Gaustadalleen 21 N-0349 Oslo, Norway
V. Hansen
Affiliation:
Stavanger University College, Departement of Technology and Natural Sciences, P.O. Box 2557 Ullandhaug N-4091 Stavanger, Norway
X.Z. Li
Affiliation:
Walter Scott Engineering Center, University of Nebraska, Lincoln, NE 68588-0656. USA

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 8 , Issue S02 , August 2002 , pp. 100 - 101
Copyright
Copyright © Microscopy Society of America 2002