The Accuracy of Crystal Structure Refinement from Electron Diffraction Data using Parallel Beam Illumination

J. Jansen

doi:10.1017/S1431927602102029

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The Accuracy of Crystal Structure Refinement from Electron Diffraction Data using Parallel Beam Illumination

Published online by Cambridge University Press: 01 August 2002

J. Jansen

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J. Jansen*: Affiliation:
Nationaal Centrum voor HREM, Technische Universiteit Delft, Rotterdamseweg 137, 2628AL Delft, Nederland

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Type: Abstract
Information: Microscopy and Microanalysis , Volume 8 , Issue S02 , August 2002 , pp. 102 - 103

DOI: https://doi.org/10.1017/S1431927602102029 [Opens in a new window]
Copyright: Copyright © Microscopy Society of America 2002

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The Accuracy of Crystal Structure Refinement from Electron Diffraction Data using Parallel Beam Illumination

Volume 8, Issue S02
J. Jansen ^(a1)
DOI: https://doi.org/10.1017/S1431927602102029

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The Accuracy of Crystal Structure Refinement from Electron Diffraction Data using Parallel Beam Illumination

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