Microscopy and Microanalysis: Volume 27 - Issue S1

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Volume 27 - Supplement S1 - August 2021

Physical Sciences Symposia

Nanoscale x-ray and Electron Microscopy Techniques and Applications in Material Science

Q.U.A.I.N.T.P.E.A.X. QUantifying Algorithmically INTrinsic Properties of Electronic Assemblies via X-ray CT

Recovering Chemistry at Atomic Resolution using Multi-Modal Spectroscopy

High-resolution X-ray source with advanced e-beam technology: pushing the resolution limitation for lab-scale NanoCT

Investigating Phase Transitions in Functional Materials and Devices by In Situ/Operando TEM

In-situ TEM irradiation induced amorphization of Ge2Sb2Te5

Temperature-Dependent Structural Evolution of Pt-Ni Nanoparticles Observed by In Situ TEM

Birth of a grain boundary: In situ TEM Observation of the Microstructure Evolution in HfO2 Based Memristors

Investigation of Phase Transformations in Ge4Sb4Te5 film using Transmission Electron Microscopy

Formation and surface melting of nanoparticle superlattices in a solution

Microscopy & Spectroscopy of Energy Conversion and Storage Materials

Cryogenic imaging and spectroscopic study of electrochemically formed solid interphases - from nano to meso scale.

Cryo-TEM study of solid electrolyte interphases in Li-ion batteries

Sweeping Potential Regulated Structural and Chemical Evolution of Solid-Electrolyte Interphase on Cu and Li as Revealed by Cryogenic Transmission Electron Microscopy

Direct observation of breathing phenomenon and phase transformation in Ni-rich cathode materials by in situ TEM

Atomic-scale mechanisms for fluorination-enhanced cycling stability of cation-disordered rocksalt cathodes

Advanced Application of Atom Probe Tomography: Specimen preparation, Instrumentation, and Data analysis

A Tomographic Atom Probe laser assisted by a flexible optical system

Evaporation-Field Differences with Deep-UV Atom Probe Tomography

An XHV atom probe with ultra-low hydrogen background

3D Nanoscale Analysis of Protein-Mineral Nanoparticle Interfaces Using Atom Probe Tomography for Understanding Amelogenesis

Graphene encapsulation enables vitreous ice sample for APT and near-atomic reconstruction of nanoparticle-liquid interface

Analytical Sciences Symposia

Diffraction Imaging Across Disciplines

A faster image simulation algorithm for scanning transmission electron microscopy

Machine Learning Based Precision Orientation and Strain Mapping from 4D Diffraction Datasets

Microscopy and Microanalysis

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Volume 27 - Supplement S1 - August 2021

Physical Sciences Symposia

Nanoscale x-ray and Electron Microscopy Techniques and Applications in Material Science

Investigating Phase Transitions in Functional Materials and Devices by In Situ/Operando TEM

Microscopy & Spectroscopy of Energy Conversion and Storage Materials

Advanced Application of Atom Probe Tomography: Specimen preparation, Instrumentation, and Data analysis

Analytical Sciences Symposia

Diffraction Imaging Across Disciplines