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High-resolution X-ray source with advanced e-beam technology: pushing the resolution limitation for lab-scale NanoCT

Published online by Cambridge University Press:  30 July 2021

Emil Espes  and
Anasuya Adibhatla
Emil Espes
Affiliation:
Excillum, United States
Anasuya Adibhatla
Affiliation:
Excillum, United States

Abstract

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Type
Nanoscale x-ray and Electron Microscopy Techniques and Applications in Material Science
Information
Microscopy and Microanalysis , Volume 27 , Supplement S1 , August 2021 , pp. 1230
Copyright
Copyright © The Author(s), 2021. Published by Cambridge University Press on behalf of the Microscopy Society of America

References

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Romell, J., et al. , Proc. of SPIE 11112, X-ray Nanoimaging: Instruments and Methods IV (2019)Google Scholar
Fella, C., et al. , Microscopy and Microanalysis, 24(S2), 234-235 (2018)CrossRefGoogle Scholar