Hostname: page-component-586b7cd67f-l7hp2 Total loading time: 0 Render date: 2024-11-26T12:21:18.020Z Has data issue: false hasContentIssue false
  • English
  • Français

Machine Learning Based Precision Orientation and Strain Mapping from 4D Diffraction Datasets

Published online by Cambridge University Press:  30 July 2021

Renliang Yuan ,
Jiong Zhang ,
Lingfeng He  and
Jian-Min Zuo
Renliang Yuan
Affiliation:
University of Illinois at Urbana-Champaign, Illinois, United States
Jiong Zhang
Affiliation:
Intel Corp, United States
Lingfeng He
Affiliation:
Idaho National Laboratory, Idaho Falls, Idaho, United States
Jian-Min Zuo
Affiliation:
University of Illinois at Urbana-Champaign, Urbana, Illinois, United States

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Diffraction Imaging Across Disciplines
Information
Microscopy and Microanalysis , Volume 27 , Supplement S1 , August 2021 , pp. 1276 - 1278
Check for updates
Copyright
Copyright © The Author(s), 2021. Published by Cambridge University Press on behalf of the Microscopy Society of America

References

Zuo, J.-M., in: Hawkes, P.W., Spence, J.C.H. (Eds.) Springer Handbook of Microscopy, Springer International Publishing, Cham, 2019, pp. 2-2.Google Scholar
Ophus, C., Microscopy and Microanalysis, 25 (2019) 563-582.CrossRefGoogle Scholar
Tate, Mark W., et al. , Microscopy and Microanalysis 22.1 (2016): 237-249; Krajnak, Matus, et al. , Ultramicroscopy 165 (2016): 42-50.Google Scholar
Silver, David, et al. , Nature 550 (2017) 354-359.Google Scholar
LeCun, Y., et al. , Nature, 521 (2015) 436-444.CrossRefGoogle Scholar
Aguiar, J.A., et al. , Science Advances, 5 (2019) eaaw1949.CrossRefGoogle Scholar
Lee, C.-H., et al. , Nano Letters, 20 (2020) 3369-3377.CrossRefGoogle Scholar
Sunde, J.K., et al. , Materials Characterization, 142 (2018) 458-469.CrossRefGoogle Scholar
Yuan, R., et al. , Ultramicroscopy, 207 (2019).Google Scholar