Hostname: page-component-586b7cd67f-2brh9 Total loading time: 0 Render date: 2024-11-26T12:35:44.702Z Has data issue: false hasContentIssue false
  • English
  • Français

Evaporation-Field Differences with Deep-UV Atom Probe Tomography

Published online by Cambridge University Press:  30 July 2021

Ty Prosa ,
Dan Lenz ,
Isabelle Martin ,
David Reinhard ,
David Larson  and
Joe Bunton
Ty Prosa
Affiliation:
CAMECA® Instruments Inc., 5470 Nobel Drive, Madison, WI 53711 USA, Wisconsin, United States
Dan Lenz
Affiliation:
CAMECA® Instruments Inc., 5470 Nobel Drive, Madison, WI 53711 USA, United States
Isabelle Martin
Affiliation:
CAMECA® Instruments Inc., 5470 Nobel Drive, Madison, WI 53711 USA, United States
David Reinhard
Affiliation:
CAMECA Instruments Inc., Madison, Wisconsin, United States
David Larson
Affiliation:
CAMECA Instruments Inc., Madison, Wisconsin, United States
Joe Bunton
Affiliation:
CAMECA® Instruments Inc., 5470 Nobel Drive, Madison, WI 53711 USA, United States

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Advanced Application of Atom Probe Tomography: Specimen preparation, Instrumentation, and Data analysis
Information
Microscopy and Microanalysis , Volume 27 , Supplement S1 , August 2021 , pp. 1262 - 1264
Check for updates
Copyright
Copyright © The Author(s), 2021. Published by Cambridge University Press on behalf of the Microscopy Society of America

References

Vurpillot, F. et al. , J. Phys. D: Appl. Phys. 42 (2009) 125502.CrossRefGoogle Scholar
Kellogg, G. L. and T, T.. Tsong, Journal of Applied Physics 51 (1980) 1184.CrossRefGoogle Scholar
Gault, B. et al. , Review of Scientific Instruments 77 (2006) 043705/1.CrossRefGoogle Scholar
Bunton, J. H. et al. , Microscopy and Microanalysis 13 (2007) 418.CrossRefGoogle Scholar
Chiaramonti, A. N. et al. , Microscopy and Microanalysis 26 (2020) 258.CrossRefGoogle Scholar
Hono, K. et al. , Ultramicroscopy 111 (2011) 576.CrossRefGoogle Scholar
Vella, A. et al. Journal of Applied Physics 110 (2011) 044321/1.CrossRefGoogle Scholar
Prosa, T. J. et al. , Microscopy and Microanalysis 21 (2015) 849.CrossRefGoogle Scholar