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Evaporation-Field Differences with Deep-UV Atom Probe Tomography

Published online by Cambridge University Press:  30 July 2021

Ty Prosa
Affiliation:
CAMECA® Instruments Inc., 5470 Nobel Drive, Madison, WI 53711 USA, Wisconsin, United States
Dan Lenz
Affiliation:
CAMECA® Instruments Inc., 5470 Nobel Drive, Madison, WI 53711 USA, United States
Isabelle Martin
Affiliation:
CAMECA® Instruments Inc., 5470 Nobel Drive, Madison, WI 53711 USA, United States
David Reinhard
Affiliation:
CAMECA Instruments Inc., Madison, Wisconsin, United States
David Larson
Affiliation:
CAMECA Instruments Inc., Madison, Wisconsin, United States
Joe Bunton
Affiliation:
CAMECA® Instruments Inc., 5470 Nobel Drive, Madison, WI 53711 USA, United States

Abstract

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Type
Advanced Application of Atom Probe Tomography: Specimen preparation, Instrumentation, and Data analysis
Copyright
Copyright © The Author(s), 2021. Published by Cambridge University Press on behalf of the Microscopy Society of America

References

Vurpillot, F. et al. , J. Phys. D: Appl. Phys. 42 (2009) 125502.CrossRefGoogle Scholar
Kellogg, G. L. and T, T.. Tsong, Journal of Applied Physics 51 (1980) 1184.CrossRefGoogle Scholar
Gault, B. et al. , Review of Scientific Instruments 77 (2006) 043705/1.CrossRefGoogle Scholar
Bunton, J. H. et al. , Microscopy and Microanalysis 13 (2007) 418.CrossRefGoogle Scholar
Chiaramonti, A. N. et al. , Microscopy and Microanalysis 26 (2020) 258.CrossRefGoogle Scholar
Hono, K. et al. , Ultramicroscopy 111 (2011) 576.CrossRefGoogle Scholar
Vella, A. et al. Journal of Applied Physics 110 (2011) 044321/1.CrossRefGoogle Scholar
Prosa, T. J. et al. , Microscopy and Microanalysis 21 (2015) 849.CrossRefGoogle Scholar