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Birth of a grain boundary: In situ TEM Observation of the Microstructure Evolution in HfO2 Based Memristors

Published online by Cambridge University Press:  30 July 2021

Robert Eilhardt ,
Alexander Zintler ,
Oscar Recalde ,
Déspina Nasiou ,
Stefan Petzold ,
Lambert Alff  and
Leopoldo Molina-Luna
Robert Eilhardt
Affiliation:
Department of Materials Science, Advanced Electron Microscopy, Technical University of Darmstadt, Darmstadt, Hessen, Germany
Alexander Zintler
Affiliation:
Department of Materials Science, Advanced Electron Microscopy, Technical University of Darmstadt, Darmstadt, Hessen, Germany
Oscar Recalde
Affiliation:
Department of Materials Science, Advanced Electron Microscopy, Technical University of Darmstadt, Darmstadt, Hessen, Germany
Déspina Nasiou
Affiliation:
Department of Materials Science, Advanced Electron Microscopy, Technical University of Darmstadt, Darmstadt, Hessen, Germany
Stefan Petzold
Affiliation:
Department of Materials Science, Advanced Thin Film Technologies, Technical University of Darmstadt, Hessen, Germany
Lambert Alff
Affiliation:
Department of Materials Science, Advanced Thin Film Technologies, Technical University of Darmstadt, Hessen, Germany
Leopoldo Molina-Luna
Affiliation:
Department of Materials Science, Advanced Electron Microscopy, Technical University of Darmstadt, Hessen, Germany

Abstract

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Type
Investigating Phase Transitions in Functional Materials and Devices by In Situ/Operando TEM
Information
Microscopy and Microanalysis , Volume 27 , Supplement S1 , August 2021 , pp. 1238 - 1239
Copyright
Copyright © The Author(s), 2021. Published by Cambridge University Press on behalf of the Microscopy Society of America

References

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