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Birth of a grain boundary: In situ TEM Observation of the Microstructure Evolution in HfO2 Based Memristors
Published online by Cambridge University Press: 30 July 2021
Abstract
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- Type
- Investigating Phase Transitions in Functional Materials and Devices by In Situ/Operando TEM
- Information
- Copyright
- Copyright © The Author(s), 2021. Published by Cambridge University Press on behalf of the Microscopy Society of America
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