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A faster image simulation algorithm for scanning transmission electron microscopy

Published online by Cambridge University Press:  30 July 2021

Philipp Pelz
Affiliation:
UC Berkeley, Berkeley, California, United States
Luis DaCosta
Affiliation:
UC Berkeley, Berkeley, California, United States
Alexander M Rakowski
Affiliation:
LBNL, United States
Mary Scott
Affiliation:
UC Berkeley, Berkeley, California, United States
Colin Ophus
Affiliation:
Lawrence Berkeley National Laboratory, California, United States

Abstract

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Type
Diffraction Imaging Across Disciplines
Copyright
Copyright © The Author(s), 2021. Published by Cambridge University Press on behalf of the Microscopy Society of America

References

Ophus, C. A fast image simulation algorithm for scanning transmission electron microscopy. Adv Struct Chem Imag 3, 13 (2017).CrossRefGoogle ScholarPubMed
Pryor, A., Ophus, C. & Miao, J. A streaming multi-GPU implementation of image simulation algorithms for scanning transmission electron microscopy. Advanced Structural and Chemical Imaging 3, 15 (2017).CrossRefGoogle ScholarPubMed
Cowley, J. M. & Moodie, A. F. The scattering of electrons by atoms and crystals. I. A new theoretical approach. Acta Crystallographica 10, 609619 (1957).CrossRefGoogle Scholar
Mallat, S. A Wavelet Tour of Signal Processing: The Sparse Way. (Academic Press, 2009).Google Scholar
Work at the Molecular Foundry was supported by the Office of Science, Office of Basic Energy Sciences, of the U.S. Department of Energy under Contract No. DE-AC02-05CH11231. CO acknowledges additional support from the U.S. Department of Energy Early Career Research Program. M. S. and P. P. acknowledge support from the STROBE NSF Science and Technology Center on Real-Time Functional Imaging.Google Scholar