Two independent methods of crystal-size distribution analysis were compared: the Bertaut-Warren-Averbach XRD technique (MudMaster computer program) and high-resolution transmission electron microscopy (HRTEM). These techniques were used to measure thickness distributions of illite crystals (fundamental particles) from sets of illite-smectites from shales and bentonites that had expandabilities ranging from 86%S to 6%S. The illite-smectites were treated with a polymer (polyvinylopyrolidone, PVP) to separate them into fundamental particles for XRD and HRTEM investigations.

A systematic difference between XRD and HRTEM results was observed: XRD (area-weighted distributions) detected a larger fraction of thick (>4 nm) and a smaller fraction of thin crystals as compared to HRTEM (number-weighted distributions). As a result, XRD-determined distributions have larger mean thickness values and larger distribution parameters (α and β2). The measurements performed by the two techniques were verified by modeling XRD patterns of the PVP-illites, using the measured distributions as inputs. The modeling indicated that the XRD-determined distributions are very accurate. Selecting broader thickness distributions in MudMaster further improved the modeling results. The HRTEM measurements underestimate the proportion of coarse particles, in particular in shale samples, and this inaccuracy is attributed to the effect of using number-weighted (rather than area-weighted) distributions and to inaccurate counting statistics for thick crystals.

The MudMaster computer program, based on the modified Bertaut-Warren- Averbach (BWA) XRD method, was used in the study of diagenetic evolution of illitic material in shales. The illitic material was characterized by XRD as a mixture of illite-smectite (I-S) and discrete illite. The experimental conditions for complete dehydration of swelling clays, necessary in this method, were established for a climate of high relative humidity (RH >40%). It was found that the distribution of crystallite thickness of dehydrated illitic material of shales is described by the lognormal law, as was established earlier by the BWA method for pure I-S from pyroclastic rocks. The parameters characterizing this distribution evolve with depth: the mean crystallite thickness (Te), the distribution broadening (DW) and the parameter of a lognormal distribution (β2) increase, whereas the percentage of the most frequent crystallite thickness decreases. The observed scatter of values is not random but indicates fluctuations in the characteristics of the illitic material of shales. The results imply that the modified Scherrer technique of measuring mean crystal thickness from the broadening of XRD reflections can be extended at least to some shales.