The transmittance (T) of thin films of CdI2, prepared by thermal evaporation technique on quartz substrates,have been measured over the wavelength range 200−900 nm. Fromanalysis of the transmittance data, the optical constants, therefractive index (n) and the extinction coefficient (k), havebeen studied. Analysis of the refractive index (n) yields a lowfrequency dielectric constant, average oscillator strength and average oscillator energy. From analysis of the absorptioncoefficient (α), the fundamental absorption edge can bedetermined. Both allowed direct transitions and allowed indirecttransitions are observed. The composition of films is checkedusing energy dispersive X-ray (EDX) spectroscopy technique. X-raydiffraction (XRD) measurements showed that the CdI2 filmsevaporated at room temperature substrates were characterized by a polycrystalline form. At large thicknesses the films indicated the inhomogeneity. The effect of annealing temperature (up to 523 K) onthe film properties has been studied.