Powder Diffraction: Volume 18 -

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Published on behalf of International Centre for Diffraction Data

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Powder Diffraction
ISSN: 0885-7156

EISSN: 1945-7413

URL: /core/journals/powder-diffraction
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Volume 18 - June 2003

Contents

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Denver X-Ray Conference

D045 Residual Strain Determination by Rietveld Refinement of TOF Neutron-Diffraction Measurements on Deformed Uranium
D. Balzar, G. Stefanic, S. Vogel, D. Brown, M. Bourke, B. Clausen, N. C. Popa
Published online by Cambridge University Press:

20 May 2016, p. 172
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D068 Three-Dimensional X-ray Diffraction Microscopy of Grain Boundaries
W. Liu, G. E. Ice, W. Yang, J. Z. Tischler, B. C. Larson
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20 May 2016, p. 172
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D031 Fast X-ray Mapping of Large Area Samples
G. Vittiglio, P. Klinger, J. Heckel, D. Wissman
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20 May 2016, p. 172
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D095 Towards Synchrotron-Quality X-ray Diffraction Data with a Laboratory Instrument
M. J. Fransen
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20 May 2016, p. 172
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F50 X-ray Coincidence Spectrometry for Quantitative Determination of Bone Lead Measurement
W. Guo, R. P. Gardner
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20 May 2016, p. 172
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D110 Combining Multiple Observations for Powder Diffraction Crystallography — Invited
B. H. Toby
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20 May 2016, p. 172
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D108 Smart Crystallographic Imaging for Chemical Engineering by MEM/Rietveld Method — Invited
M. Takata, M. Sakata
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20 May 2016, p. 172
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D007 Solving Neighboring Element Problems in Type-I Clathrates Using Resonant Diffraction: Successes and Problems — Invited
A. P. Wilkinson, Y. Zhang, P. L. Lee, G. S. Nolas
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20 May 2016, p. 172
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D069 Revealing Structural Change by the Temperature Dependence of Atomic Displacement Parameters — Invited
B. C. Chakoumakos
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20 May 2016, p. 172
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D036 Combined X-ray and Neutron Diffraction Rietveld Refinements of Three-Layer Aurivillius Ceramics
M. S. Haluska, S. T. Misture
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20 May 2016, p. 173
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D041 High Resolution X-ray Diffraction Studies of Epitaxially Grown GaN/SiC(0001) - Growth Conditions, Defect Density and Stress
N. Faleev, H. Temkin, I. Ahmad, M. Holtz, Yu. Melnik
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20 May 2016, p. 173
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F47 Performance and Application of Mirror-Based X-ray Fluorescence Microprobes at the Advanced Photon Source and the National Synchrotron Light Source — Invited
S. R. Sutton, M. Newville, P. Eng, M. Rivers, A. Lanzirotti
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20 May 2016, p. 173
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D040 Routine Texture Analysis of Neutron TOF Data Using the Rietveld Method
S. Vogel, R. B. Von Dreele, L. Lutterotti, H.-R. Wenk
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20 May 2016, p. 173
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“X-ray Scattering for Semiconductor Heterostructurex Analysis” - Invited
M. Goorsky
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20 May 2016, p. 173
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“From the Lab to The Fab: Automated High-Resolution X-ray Metrology for the Silicon Semiconductor Industry” - Invited
M. Wormington
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20 May 2016, p. 173
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D012 Investigation of the Mesoscopic Interface Structure of Thin Films with Diffuse X-ray Scattering
J. Stümpel, I. Busch
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20 May 2016, p. 173
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D092 Structural Characterization of SiGe and SiGe:C Heterostructures Using a Combination of X-ray Methods
J. F. Woitok
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20 May 2016, p. 173
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D118 Universal Theory for the Determination of both Screw and Edge Dislocation Densities for GAN and Related Materials Using High Resolution X-ray Diffraction
S. Bates
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20 May 2016, p. 173
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D121 Structure Investigations of Thin Films and Lateral Nanostructures by Means of X-ray Grazing Incidence Diffraction - Invited
J. Grenzer, U. Pietsch
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20 May 2016, p. 173
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D086 High-Resolution Grazing Incidence In-Plane Diffraction in the Laboratory
B. K. Tanner, T. P. A. Hase, T. A. Lafford, M. S. Goorsky
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20 May 2016, p. 173
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Page 5 of 10

First
« Prev
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3
4
5
6
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Last

Powder Diffraction

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Volume 18 - June 2003

Denver X-Ray Conference

D045 Residual Strain Determination by Rietveld Refinement of TOF Neutron-Diffraction Measurements on Deformed Uranium

D068 Three-Dimensional X-ray Diffraction Microscopy of Grain Boundaries

D031 Fast X-ray Mapping of Large Area Samples

D095 Towards Synchrotron-Quality X-ray Diffraction Data with a Laboratory Instrument

F50 X-ray Coincidence Spectrometry for Quantitative Determination of Bone Lead Measurement

D110 Combining Multiple Observations for Powder Diffraction Crystallography — Invited

D108 Smart Crystallographic Imaging for Chemical Engineering by MEM/Rietveld Method — Invited

D007 Solving Neighboring Element Problems in Type-I Clathrates Using Resonant Diffraction: Successes and Problems — Invited

D069 Revealing Structural Change by the Temperature Dependence of Atomic Displacement Parameters — Invited

D036 Combined X-ray and Neutron Diffraction Rietveld Refinements of Three-Layer Aurivillius Ceramics

D041 High Resolution X-ray Diffraction Studies of Epitaxially Grown GaN/SiC(0001) - Growth Conditions, Defect Density and Stress

F47 Performance and Application of Mirror-Based X-ray Fluorescence Microprobes at the Advanced Photon Source and the National Synchrotron Light Source — Invited

D040 Routine Texture Analysis of Neutron TOF Data Using the Rietveld Method

“X-ray Scattering for Semiconductor Heterostructurex Analysis” - Invited

“From the Lab to The Fab: Automated High-Resolution X-ray Metrology for the Silicon Semiconductor Industry” - Invited

D012 Investigation of the Mesoscopic Interface Structure of Thin Films with Diffuse X-ray Scattering

D092 Structural Characterization of SiGe and SiGe:C Heterostructures Using a Combination of X-ray Methods

D118 Universal Theory for the Determination of both Screw and Edge Dislocation Densities for GAN and Related Materials Using High Resolution X-ray Diffraction

D121 Structure Investigations of Thin Films and Lateral Nanostructures by Means of X-ray Grazing Incidence Diffraction - Invited

D086 High-Resolution Grazing Incidence In-Plane Diffraction in the Laboratory

Powder Diffraction

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Volume 18 - June 2003

Denver X-Ray Conference