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D092 Structural Characterization of SiGe and SiGe:C Heterostructures Using a Combination of X-ray Methods

Published online by Cambridge University Press:  20 May 2016

J. F. Woitok
J. F. Woitok
Affiliation:
PANalytical B.V., Almelo, The Netherlands
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Abstract

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Type
Denver X-Ray Conference
Information
Powder Diffraction , Volume 18 , Issue 2 , June 2003 , pp. 173
Copyright
Copyright © Cambridge University Press 2003

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