Powder Diffraction: Volume 18 -

Phosphorus: New in situ powder data from large-volume apparatus
Wilson A. Crichton, Mohamed Mezouar, Giulio Monaco, Sara Falconi
Published online by Cambridge University Press:

06 March 2012, pp. 155-158
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Improved X-ray powder diffraction data for orthorhombic phosphorus, S.G. C mca (64) obtained in situ at synthesis conditions of 1.2 GPa and 1100 K, are described. Representative, as synthesized, data include 2.552X, 3.3204, 2.5953, 5.1912, 1.6302, for least-squares unit-cell a=3.3182(6) Å, b=10.3744(18) Å and c=4.3227(9) Å. As an illustration of the quality of the data, the structure was solved from powder XRD and Rietveld refined to give a=3.3199(2) Å, b= 10.3678(4) Å, c=4.3154(2)Å, and V=148.535(12) Å3 with the P atom on 8f (1/2, y,z) with y=0.1044(22) and z=0.9179(7).

Howard F. McMurdie
Alan D. Mighell, Winnie Wong-Ng, Gasper J. Piermarini
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06 March 2012, pp. 271-272
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Powder X-ray diffraction study of LaCo0.5Ni0.5O3−δ and LaCo0.5Fe0.5O3−δ
N. P. Vyshatko, V. V. Kharton, A. L. Shaula, F. M. B. Marques
Published online by Cambridge University Press:

06 March 2012, pp. 159-161
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The crystal structures of LaCo0.5Ni0.5O3−δ and LaCo0.5Fe0.5O3−δ solid solutions, studied by powder X-ray diffraction, were found to be rhombohedral perovskite. The unit cell parameters in the hexagonal setting are a=5.491(6) Å and c=13.231(3) Å for LaCo0.5Fe0.5O3−δ, and a=5.464(4) Å and c=13.125(3) Å for LaCo0.5Ni0.5O3−δ. The space group is R3c (No. 167).

European Materials Research Society (E-MRS) Spring Meeting Report
Norberto Masciocchi
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06 March 2012, pp. 272-273
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X-ray powder diffraction data for ammonium D-gluconate, C6H11O7−NH4+
F. J. W. J. Labuschagné, S. M. C. Verryn, W. W. Focke
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06 March 2012, pp. 162-164
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The compound ammonium D-gluconate (C6H11O7−NH4+) has been studied by X-ray powder diffraction. The powder diffraction pattern and data obtained at room temperature are presented (cell data and powder data summary).

British Crsytallographic Association Spring Meeting, 15–17 April 2003, York
James A. Kaduk
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06 March 2012, pp. 274-275
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Denver X-ray Conference
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06 March 2012, pp. 165-170
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Calendar of Meetings
Donald R. Petersen
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06 March 2012, pp. 275-276
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F49 Characterization Techniques for Miniature Low-Power X-ray Tubes
D. Clark Turner, A. Reyes-Mena, M. Moras, C. Jensen, S. D. Liddiard
Published online by Cambridge University Press:

20 May 2016, p. 171
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Short Courses & Workshops
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06 March 2012, pp. 276-277
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D039 Recent Developments of Curved Graded Multilayers and Multilayer Monochromator Systems for Application on Point and Line Focus X-ray Sources
T. Holz, R. Dietsch, D. Weißbach, S. Braun, T. Böttger
Published online by Cambridge University Press:

20 May 2016, p. 171
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D009 Retractable Knife-Edge for XRD Combinatorial Screening
B. B. He, F. F. Jin, B. Litteer, U. Preckwinkel, K. L. Smith
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20 May 2016, p. 171
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D122 X-ray Diffraction Studies of Grain Nanostructures in Single Tin Oxide Nanobelts
Z. Cai, Y. Xiao, Z. Wang
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20 May 2016, p. 171
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D047 A High-Temperature Powder Diffraction Furnace II
M. D. Dolan, S. Zdzieszynski, S. T. Misture
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20 May 2016, p. 171
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D039 Recent Developments of Curved Graded Multilayers and Multilayer Monochromator Systems for Application on Point and Line Focus X-ray Sources
T. Holz, R. Dietsch, D. Weißbach, S. Braun, T. Böttger
Published online by Cambridge University Press:

20 May 2016, p. 171
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D009 Retractable Knife-Edge for XRD Combinatorial Screening
B. B. He, F. F. Jin, B. Litteer, U. Preckwinkel, K. L. Smith
Published online by Cambridge University Press:

20 May 2016, p. 171
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D122 X-ray Diffraction Studies of Grain Nanostructures in Single Tin Oxide Nanobelts
Z. Cai, Y. Xiao, Z. Wang
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20 May 2016, p. 171
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D047 A High-Temperature Powder Diffraction Furnace II
M. D. Dolan, S. Zdzieszynski, S. T. Misture
Published online by Cambridge University Press:

20 May 2016, p. 171
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D080 X-ray Diffraction Metrology Tool for Microstructure Control on 300mm Wafers for Silicon Based Semiconductors
K. J. Kozaczek, P. R. Moran, D. S. Kurtz, R. I. Martin, L. Y. Huang, A. Stratilatov
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20 May 2016, p. 172
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D120 Structure- Property Relationships of Superconducting and Heavy Fermion Intermetallics — Invited
J. Chan
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20 May 2016, p. 172
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Powder Diffraction

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Volume 18 - June 2003

New Diffraction Data

Phosphorus: New in situ powder data from large-volume apparatus

International Reports

Howard F. McMurdie

New Diffraction Data

Powder X-ray diffraction study of LaCo0.5Ni0.5O3−δ and LaCo0.5Fe0.5O3−δ

International Reports

European Materials Research Society (E-MRS) Spring Meeting Report

New Diffraction Data

X-ray powder diffraction data for ammonium D-gluconate, C6H11O7−NH4+

International Reports

British Crsytallographic Association Spring Meeting, 15–17 April 2003, York

Denver X-Ray Conference

Denver X-ray Conference

International Reports

Calendar of Meetings

Denver X-Ray Conference

F49 Characterization Techniques for Miniature Low-Power X-ray Tubes

International Reports

Short Courses & Workshops

Denver X-Ray Conference

D039 Recent Developments of Curved Graded Multilayers and Multilayer Monochromator Systems for Application on Point and Line Focus X-ray Sources

D009 Retractable Knife-Edge for XRD Combinatorial Screening

D122 X-ray Diffraction Studies of Grain Nanostructures in Single Tin Oxide Nanobelts

D047 A High-Temperature Powder Diffraction Furnace II

D039 Recent Developments of Curved Graded Multilayers and Multilayer Monochromator Systems for Application on Point and Line Focus X-ray Sources

D009 Retractable Knife-Edge for XRD Combinatorial Screening

D122 X-ray Diffraction Studies of Grain Nanostructures in Single Tin Oxide Nanobelts

D047 A High-Temperature Powder Diffraction Furnace II

D080 X-ray Diffraction Metrology Tool for Microstructure Control on 300mm Wafers for Silicon Based Semiconductors

D120 Structure- Property Relationships of Superconducting and Heavy Fermion Intermetallics — Invited

Powder Diffraction

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Actions for selected content:

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Volume 18 - June 2003

New Diffraction Data

International Reports

New Diffraction Data

International Reports

New Diffraction Data

International Reports

Denver X-Ray Conference

International Reports

Denver X-Ray Conference

International Reports

Denver X-Ray Conference