Powder Diffraction: Volume 18 -

$Published on behalf of International Centre for Diffraction Data$

Published on behalf of International Centre for Diffraction Data

Only show content I have access to (7)

Over 3 years (198)

View selected items
Save to my bookmarks
Export citations
Download PDF (zip)
Save to Kindle
Save to Dropbox
Save to Google Drive
Save content to
To save this undefined to your undefined account, please select one or more formats and confirm that you agree to abide by our usage policies. If this is the first time you used this feature, you will be asked to authorise Cambridge Core to connect with your undefined account. Find out more about saving content to .

To save this article to your Kindle, first ensure [email protected] is added to your Approved Personal Document E-mail List under your Personal Document Settings on the Manage Your Content and Devices page of your Amazon account. Then enter the ‘name’ part of your Kindle email address below. Find out more about saving to your Kindle.

Note you can select to save to either the @free.kindle.com or @kindle.com variations. ‘@free.kindle.com’ emails are free but can only be saved to your device when it is connected to wi-fi. ‘@kindle.com’ emails can be delivered even when you are not connected to wi-fi, but note that service fees apply.

Find out more about the Kindle Personal Document Service.

Please be advised that item(s) you selected are not available.
You are about to save
Powder Diffraction
ISSN: 0885-7156

EISSN: 1945-7413

URL: /core/journals/powder-diffraction
Your Kindle email address

Please provide your Kindle email.

@free.kindle.com @kindle.com (service fees apply)

By using this service, you agree that you will only keep content for personal use, and will not openly distribute them via Dropbox, Google Drive or other file sharing services

< Back to all issues

Volume 18 - June 2003

Contents

Page 7 of 10

Denver X-Ray Conference

D060 Synchrotron X-ray Phase Radiography and Absorption Micro-CT of Regenerating Newt Limbs
S. R. Stock, M. Gradassi, H. G. Simon, K. Ignatiev, I. Smolsky, H. Tsuruta, F. De Carlo
Published online by Cambridge University Press:

20 May 2016, p. 176
- Article
- - Get access
    
    Check if you have access via personal or institutional login
    
    Log in Register
- Export citation

C07 Synchrotron Applications in Archaeometallurgy: Analysis of High Zinc Brass Astrolabes
B. Newbury, M. Notis, G. S. Cargill III, B. Stephenson, J. Almer, D. Haeffner, B. Stephenson
Published online by Cambridge University Press:

20 May 2016, p. 176
- Article
- - Get access
    
    Check if you have access via personal or institutional login
    
    Log in Register
- Export citation

D037 In Situ Measurement of Growth Stress in Alumina Scale — Invited
E. D. Specht, P. F. Tortorelli, K. L. More, P. Zschack
Published online by Cambridge University Press:

20 May 2016, p. 176
- Article
- - Get access
    
    Check if you have access via personal or institutional login
    
    Log in Register
- Export citation

D075 Precipitation Kinetics and Deformation Behavior of TIAL-W Alloys at Elevated Temperatures — Invited
H. Choo, D. Seo, J. Beddoes, M. A. M. Bourke
Published online by Cambridge University Press:

20 May 2016, p. 176
- Article
- - Get access
    
    Check if you have access via personal or institutional login
    
    Log in Register
- Export citation

D051 Shock-Induced Deformation of Tungsten Powder
D. W. Richards, M. P. Kramer, J. W. House, D. P. Shea, D. A. Cunard, R. J. De Angelis
Published online by Cambridge University Press:

20 May 2016, p. 176
- Article
- - Get access
    
    Check if you have access via personal or institutional login
    
    Log in Register
- Export citation

D053 Relaxation of Residual Stress in Shot Peened Ti-6A1-4V Due to Fretting Fatigue
S. A. Martinez, S. Sathish, S. Mall, M. P. Blodgett
Published online by Cambridge University Press:

20 May 2016, p. 176
- Article
- - Get access
    
    Check if you have access via personal or institutional login
    
    Log in Register
- Export citation

D099 Powder Diffraction Pattern of Oriented Magnetic Particles Induced by Magnetic Field
X. Luo, S. Liu
Published online by Cambridge University Press:

20 May 2016, p. 176
- Article
- - Get access
    
    Check if you have access via personal or institutional login
    
    Log in Register
- Export citation

D123 Strain Effects in Thin Film / SI Substrates Revealed by X-ray Microdiffraction
C. E. Murray, I. C. Noyan, B. Lai, Z. Cai
Published online by Cambridge University Press:

20 May 2016, p. 176
- Article
- - Get access
    
    Check if you have access via personal or institutional login
    
    Log in Register
- Export citation

D082 Residual Stresses in Thin TaNx/Ta Bilayers: Origin and Evolution
K. J. Kozaczek
Published online by Cambridge University Press:

20 May 2016, p. 176
- Article
- - Get access
    
    Check if you have access via personal or institutional login
    
    Log in Register
- Export citation

F45 The Perspective of TXRF for Environmental Analysis - Invited
S. Török, J. Osán, B. Beckhoff, G. Ulm, E. Curis
Published online by Cambridge University Press:

20 May 2016, p. 177
- Article
- - Get access
    
    Check if you have access via personal or institutional login
    
    Log in Register
- Export citation

F27 Elemental Imaging of Sea Urchin Tooth
G. J. Havrilla, T. C. Miller, S. Stock
Published online by Cambridge University Press:

20 May 2016, p. 177
- Article
- - Get access
    
    Check if you have access via personal or institutional login
    
    Log in Register
- Export citation

F36 Focused Beam TXRF System Using Doubly Curved Crystals — Invited
Z. W. Chen
Published online by Cambridge University Press:

20 May 2016, p. 177
- Article
- - Get access
    
    Check if you have access via personal or institutional login
    
    Log in Register
- Export citation

F04 Characterization of Urban Air Pollution by Total Reflection X-ray Fluorescence
M. Schmeling
Published online by Cambridge University Press:

20 May 2016, p. 177
- Article
- - Get access
    
    Check if you have access via personal or institutional login
    
    Log in Register
- Export citation

F09 TXRF Analysis Using Nanoliter Droplet Methodology in Semiconductor Applications
T. C. Miller, G. J. Havrilla, C. Sparks, M. Beebe
Published online by Cambridge University Press:

20 May 2016, p. 177
- Article
- - Get access
    
    Check if you have access via personal or institutional login
    
    Log in Register
- Export citation

F23 A Novel TXRF Instrumentation for Contamination Control on 300 mm Silicon Wafers Employing Synchrotron Radiation
B. Beckhoff, R. Fliegauf, G. Ulm, J. Weser, T. Ehmann, L. Fabry, C. Mantler, S. Pahlke
Published online by Cambridge University Press:

20 May 2016, p. 177
- Article
- - Get access
    
    Check if you have access via personal or institutional login
    
    Log in Register
- Export citation

F01 Depth Sensitive X-ray Fluorescence Analysis with X-ray Optics— Invited
B. Kanngießer, W. Malzer
Published online by Cambridge University Press:

20 May 2016, p. 177
- Article
- - Get access
    
    Check if you have access via personal or institutional login
    
    Log in Register
- Export citation

C12 X-ray Optics: The Driving Force of New Technologies for X-ray Analysis— Invited
N. Gao, D. Gibson
Published online by Cambridge University Press:

20 May 2016, p. 177
- Article
- - Get access
    
    Check if you have access via personal or institutional login
    
    Log in Register
- Export citation

F26 Stereoview Elemental X-ray Imaging
G. J. Havrilla, T. C. Miller, R. W. Morton, K. G. Huntley
Published online by Cambridge University Press:

20 May 2016, p. 177
- Article
- - Get access
    
    Check if you have access via personal or institutional login
    
    Log in Register
- Export citation

C11 Beam Intensity/Detector Configuration Optimization with Numerical Methods
D. Kenning
Published online by Cambridge University Press:

20 May 2016, p. 177
- Article
- - Get access
    
    Check if you have access via personal or institutional login
    
    Log in Register
- Export citation

D032 Microfocusing Source and Multilayer Optics Based SAXS Camera
L. Jiang, S. Seshadri, B. Verman, B. Kim, Y. Platonov
Published online by Cambridge University Press:

20 May 2016, p. 178
- Article
- - Get access
    
    Check if you have access via personal or institutional login
    
    Log in Register
- Export citation

Page 7 of 10

Powder Diffraction

Refine listing

Actions for selected content:

Volume 18 - June 2003

Denver X-Ray Conference

D060 Synchrotron X-ray Phase Radiography and Absorption Micro-CT of Regenerating Newt Limbs

C07 Synchrotron Applications in Archaeometallurgy: Analysis of High Zinc Brass Astrolabes

D037 In Situ Measurement of Growth Stress in Alumina Scale — Invited

D075 Precipitation Kinetics and Deformation Behavior of TIAL-W Alloys at Elevated Temperatures — Invited

D051 Shock-Induced Deformation of Tungsten Powder

D053 Relaxation of Residual Stress in Shot Peened Ti-6A1-4V Due to Fretting Fatigue

D099 Powder Diffraction Pattern of Oriented Magnetic Particles Induced by Magnetic Field

D123 Strain Effects in Thin Film / SI Substrates Revealed by X-ray Microdiffraction

D082 Residual Stresses in Thin TaNx/Ta Bilayers: Origin and Evolution

F45 The Perspective of TXRF for Environmental Analysis - Invited

F27 Elemental Imaging of Sea Urchin Tooth

F36 Focused Beam TXRF System Using Doubly Curved Crystals — Invited

F04 Characterization of Urban Air Pollution by Total Reflection X-ray Fluorescence

F09 TXRF Analysis Using Nanoliter Droplet Methodology in Semiconductor Applications

F23 A Novel TXRF Instrumentation for Contamination Control on 300 mm Silicon Wafers Employing Synchrotron Radiation

F01 Depth Sensitive X-ray Fluorescence Analysis with X-ray Optics— Invited

C12 X-ray Optics: The Driving Force of New Technologies for X-ray Analysis— Invited

F26 Stereoview Elemental X-ray Imaging

C11 Beam Intensity/Detector Configuration Optimization with Numerical Methods

D032 Microfocusing Source and Multilayer Optics Based SAXS Camera

Powder Diffraction

Refine listing

Actions for selected content:

Save Search

Volume 18 - June 2003

Denver X-Ray Conference