Powder Diffraction: Volume 18 -

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Published on behalf of International Centre for Diffraction Data

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Powder Diffraction
ISSN: 0885-7156

EISSN: 1945-7413

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Volume 18 - June 2003

Contents

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Denver X-Ray Conference

F13 Application of Fluorescent Microtomography and Other X-ray Fluorescence Techniques - Invited
A. Simionovici, B. Golosio, A. Somogyi, L. Lemelle
Published online by Cambridge University Press:

20 May 2016, p. 174
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Characterization of Metalloprotein Metal Sites: High Throughput Approaches to Biological X-ray Absorption Spectroscopy - Invited
J. Penner-Hahn
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20 May 2016, p. 174
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C03 Observation of Atomic Arrangements in Si1-xGex Crystals by X-ray Fluorescence Holography
K. Hayashi, Y. Takahashi, E. Matsubara, I. Yonenaga
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20 May 2016, p. 174
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F35 Variation of PB and CA Concentration in Compact and Spongy Bone Determined by ΜSR-XRF at Hasylab, Beamline L
P. Wobrauschek, N. Zöger, G. Pepponi, C. Streli, G. Falkenberg, W. Osterode
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20 May 2016, p. 174
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D119 From Basic Science to New Flat Panel Displays: Solving the LC-Alignment Puzzle Using NEXAFS Spectroscopy - Invited
J. Lüning
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20 May 2016, p. 174
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F22 Recent Advances in High-Resolution Sources and High-Resolution Detectors for Soft X-ray Fluorescence Analysis: TXRF-NEXAFS and STJS - Invited
B. Beckhoff
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20 May 2016, p. 174
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F44 Improvements in Low-Power End-Window Transmission-Target X-ray Tubes
C. Jensen, S. D. Liddiard, A. Reyes-Mena, M. Moras, D. C. Turner, S. M. Elliott
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20 May 2016, p. 174
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C08 Status of Compact and Portable Laser-Compton Scattering Source at the Idaho Accelerator Center
K. Chouffani, D. Wells, F. Harmon, Y. Toyoda, J. Jones, G. Lancaster
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20 May 2016, p. 174
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C04 State-of-the-Art Silicon Detectors for X-ray Spectroscopy
P. Lechner, R. Hartmann, P. Holl, H. Soltau, N. Meidinger, G. Schaller, F. Schopper, L. Strüder, G. Lutz, R. H. Richter
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20 May 2016, p. 174
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C05 Silicon Drift Detectors for High Resolution, High Count Rate X-ray Spectroscopy at Room Temperature
P. Lechner, H. Soltau, C. Fiorini, A. Longoni, G. Lutz, L. Strüder
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20 May 2016, p. 175
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D043 Phase Identification and Sequence Characterization in Ni-Si Thin Films at Low Temperature
C. Coia, P. Desjardins, C. Lavoie, C. Detavernier
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20 May 2016, p. 175
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D013 The Use of X-ray Scattering for Medical Diagnosis
K. D. Rodgers, A. Round, C. J. Hall, R. A. Lewis, A. Hufton
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20 May 2016, p. 175
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C13 1- and 2-Dimensional Detection Systems and the Problem of Sample Fluorescence in X-ray Diffractometry
M. J. Fransen, A. C. Vermeulen
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20 May 2016, p. 175
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D111 A New “Vortex” Detector System for X-ray Powder Diffractometry
G. Fuginawa, M. Kuribayashi, J. Harada, S. Barkan, J. S. Iwanczyk, B. E. Patt, L. Feng, C. R. Tull
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20 May 2016, p. 175
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New Detector Technologies for X-ray Diffraction — Invited
R. Durst
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20 May 2016, p. 175
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D071 Coherent X-ray Scattering on Magnetic Nanostructures — Invited
S. Eisebitt
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20 May 2016, p. 175
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D017 Texture and Microstructure Analysis with High-Energy Synchrotron Radiation — Invited
H. J. Bunge
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20 May 2016, p. 175
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D035 Depth Resolved Strain Analysis of Lateral Nonostructures Produced by Focused GA ION Implantation in GAAS
J. Grenzer, U. Pietsch, B. Köhler
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20 May 2016, p. 175
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D107 Measurement of Strain Fields Around Domains in BaTiO3 Using X-ray Microdiffraction
R. C. Rogan, E. Üstündag, M. Motahari, N. Tamura
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20 May 2016, p. 175
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D062 Fatigue Crack Study Using X-ray Phase Contrast and Multiple Angle Stereometry Methods
K. Ignatiev, S. R. Stock
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20 May 2016, p. 175
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Page 6 of 10

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Powder Diffraction

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Volume 18 - June 2003

Denver X-Ray Conference

F13 Application of Fluorescent Microtomography and Other X-ray Fluorescence Techniques - Invited

Characterization of Metalloprotein Metal Sites: High Throughput Approaches to Biological X-ray Absorption Spectroscopy - Invited

C03 Observation of Atomic Arrangements in Si1-xGex Crystals by X-ray Fluorescence Holography

F35 Variation of PB and CA Concentration in Compact and Spongy Bone Determined by ΜSR-XRF at Hasylab, Beamline L

D119 From Basic Science to New Flat Panel Displays: Solving the LC-Alignment Puzzle Using NEXAFS Spectroscopy - Invited

F22 Recent Advances in High-Resolution Sources and High-Resolution Detectors for Soft X-ray Fluorescence Analysis: TXRF-NEXAFS and STJS - Invited

F44 Improvements in Low-Power End-Window Transmission-Target X-ray Tubes

C08 Status of Compact and Portable Laser-Compton Scattering Source at the Idaho Accelerator Center

C04 State-of-the-Art Silicon Detectors for X-ray Spectroscopy

C05 Silicon Drift Detectors for High Resolution, High Count Rate X-ray Spectroscopy at Room Temperature

D043 Phase Identification and Sequence Characterization in Ni-Si Thin Films at Low Temperature

D013 The Use of X-ray Scattering for Medical Diagnosis

C13 1- and 2-Dimensional Detection Systems and the Problem of Sample Fluorescence in X-ray Diffractometry

D111 A New “Vortex” Detector System for X-ray Powder Diffractometry

New Detector Technologies for X-ray Diffraction — Invited

D071 Coherent X-ray Scattering on Magnetic Nanostructures — Invited

D017 Texture and Microstructure Analysis with High-Energy Synchrotron Radiation — Invited

D035 Depth Resolved Strain Analysis of Lateral Nonostructures Produced by Focused GA ION Implantation in GAAS

D107 Measurement of Strain Fields Around Domains in BaTiO3 Using X-ray Microdiffraction

D062 Fatigue Crack Study Using X-ray Phase Contrast and Multiple Angle Stereometry Methods

Powder Diffraction

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Volume 18 - June 2003

Denver X-Ray Conference