Powder Diffraction: Volume 22 -

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Published on behalf of International Centre for Diffraction Data

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Powder Diffraction
ISSN: 0885-7156

EISSN: 1945-7413

URL: /core/journals/powder-diffraction
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Volume 22 - June 2007

Contents

Page 10 of 11

Denver X-Ray Conference

D-12 Invited—Multi-Tasking On a Ccd and Mwpc Three-Circle X-ray Diffractometer
J. Reibenspies, N. Bhuvanesh
Published online by Cambridge University Press:

20 May 2016, p. 189
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D-3 Microstructure Characterization of Mollusk Shells by XRD Using An Area Detector
A. B. Rodriguez-Navarro, A. G. Checa
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20 May 2016, p. 189
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D-4 XRD Phase Identification with Linear and Area Detectors
B. B. He
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20 May 2016, p. 189
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D-5 Mikrogap Detector Technology Applied to Small Angle X-ray Scattering
K. Erlacher, D. Khazins, R. Durst
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20 May 2016, p. 189
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D-100 Invited—Software for Analysis and Reduction of 2-D Data
S. C. Vogel, K. Knorr
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20 May 2016, p. 189
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D-14 Enhancing XRD2 Microdiffraction with Focusing X-ray Microlenses
C. Berthold, J. Brechbuehl, L. Bruegemann, A. Bjeoumikhov
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20 May 2016, p. 189
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D-19 Combining 2D and Point Detectors for Rapid and High-Resolution High-Energy X-ray Diffraction of Powders and Single Crystals in Multiple Sample Environments
Y. Ren
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20 May 2016, p. 189
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D-77 Elastic Properties of Metallic Thin Films: 2D Synchrotron XRD Analysis and in Situ Tensile Testing
G. Geandier, P.-O. Renault, Ph. Goudeau, E. Le Bourhis, B. Girault
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20 May 2016, p. 189
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D-91 Stress and Composition Evaluation for Gradient Nitride Coatings
A. Ulyanenkov, J. Brechbühl, V. V. Uglov, V. M. Anishchik, S. V. Zlotski, T. A. Alexeeva, A. Lazar
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20 May 2016, p. 189
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D-29 Invited—Managing An X-ray Diffraction Laboratory with Responsibilities to Research, Development, Engineering and Production
B. R. Wheaton
Published online by Cambridge University Press:

20 May 2016, p. 190
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D-118 X-ray Diffraction Characterization of Nanomaterials Used in Imaging Applications
T. N. Blanton, C. L. Barnes
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20 May 2016, p. 190
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D-25 Developing Powder X-ray Diffraction (Xrd) Quantitative Method for Oros® Rwj-333369 Polymorphs
M. Varasteh, Z. Deng, H. Hwang, Y. J. Kim, G. B. Wong, R. Weyers
Published online by Cambridge University Press:

20 May 2016, p. 190
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D-34 Measurement of Residual Stresses Inside 50 Mm Inner Diameter Pipes Using a Miniature Goniometer Head
M. Belassel, J. Pineault, M. Brauss
Published online by Cambridge University Press:

20 May 2016, p. 190
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D-50 in Situ Characterization of High-Temperature Shift Catalysts
A. M. Molenbroek, R. E. Johnsen, K. Sta˚hl
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20 May 2016, p. 190
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D-59 a Compact High-Brilliance Saxs/Swaxs/Gisaxs—Instrument for Laboratory Use
P. Laggner, M. Kriechbaum
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20 May 2016, p. 190
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D-83 in Situ XRD Analysis of (CfX)N Batteries: Signal Extraction by Multivariate Analysis
M. A. Rodriguez, M. R. Keenan, G. Nagasubramanian
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20 May 2016, p. 190
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D-17 Determination of the Distribution of [001] Crystal Direction in Grain-Oriented Silicon Steel by Asymmetrical X-ray Diffraction Method
J. Fang
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20 May 2016, p. 190
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D-40 Non Destructive Testing On Surfaces of Industrial Components from Distance XRD
G. Berti, A. Nicoletta
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20 May 2016, p. 190
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F-35 Invited—Advances in Handheld XRF Designs and Challenges in Meeting Rohs/Weee Directives
S. Afshari, P. Bennett
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20 May 2016, p. 191
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F-52 Invited—Materials Analysis with Handheld XRF for Compliance with Rohs and Weee Directives—Opportunities and Challenges
S. Piorek
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20 May 2016, p. 191
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Page 10 of 11

Powder Diffraction

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Volume 22 - June 2007

Denver X-Ray Conference

D-12 Invited—Multi-Tasking On a Ccd and Mwpc Three-Circle X-ray Diffractometer

D-3 Microstructure Characterization of Mollusk Shells by XRD Using An Area Detector

D-4 XRD Phase Identification with Linear and Area Detectors

D-5 Mikrogap Detector Technology Applied to Small Angle X-ray Scattering

D-100 Invited—Software for Analysis and Reduction of 2-D Data

D-14 Enhancing XRD2 Microdiffraction with Focusing X-ray Microlenses

D-19 Combining 2D and Point Detectors for Rapid and High-Resolution High-Energy X-ray Diffraction of Powders and Single Crystals in Multiple Sample Environments

D-77 Elastic Properties of Metallic Thin Films: 2D Synchrotron XRD Analysis and in Situ Tensile Testing

D-91 Stress and Composition Evaluation for Gradient Nitride Coatings

D-29 Invited—Managing An X-ray Diffraction Laboratory with Responsibilities to Research, Development, Engineering and Production

D-118 X-ray Diffraction Characterization of Nanomaterials Used in Imaging Applications

D-25 Developing Powder X-ray Diffraction (Xrd) Quantitative Method for Oros® Rwj-333369 Polymorphs

D-34 Measurement of Residual Stresses Inside 50 Mm Inner Diameter Pipes Using a Miniature Goniometer Head

D-50 in Situ Characterization of High-Temperature Shift Catalysts

D-59 a Compact High-Brilliance Saxs/Swaxs/Gisaxs—Instrument for Laboratory Use

D-83 in Situ XRD Analysis of (CfX)N Batteries: Signal Extraction by Multivariate Analysis

D-17 Determination of the Distribution of [001] Crystal Direction in Grain-Oriented Silicon Steel by Asymmetrical X-ray Diffraction Method

D-40 Non Destructive Testing On Surfaces of Industrial Components from Distance XRD

F-35 Invited—Advances in Handheld XRF Designs and Challenges in Meeting Rohs/Weee Directives

F-52 Invited—Materials Analysis with Handheld XRF for Compliance with Rohs and Weee Directives—Opportunities and Challenges

Powder Diffraction

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Volume 22 - June 2007

Denver X-Ray Conference