Research Article
Microstructural Aspects and Mechanism of Degradation of 4H-SiC PiN Diodes under Forward Biasing
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- Published online by Cambridge University Press:
- 15 March 2011, J6.1
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Mechanisms of Stacking Fault Growth in SiC PiN Diodes
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- Published online by Cambridge University Press:
- 15 March 2011, J6.4
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Formation of Si/SiC heterostructures for silicon-based quantum devices using single CH3SiH3-gas source free jet
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- Published online by Cambridge University Press:
- 15 March 2011, J5.11
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