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Automation of Supported Nanoparticle Recognition in Low Contrast STEM Images

Published online by Cambridge University Press:  22 July 2022

Mads Lützen ,
Daniel Kelly ,
Thomas E. L. Smitshuysen  and
Christian D. Damsgaard
Mads Lützen
Affiliation:
Technical University of Denmark - Nanolab, Kgs. Lyngby, Hovedstaden, Denmark
Daniel Kelly
Affiliation:
Technical University of Denmark - Nanolab, Kgs. Lyngby, Hovedstaden, Denmark
Thomas E. L. Smitshuysen
Affiliation:
Technical University of Denmark - Physics, Kgs. Lyngby, Hovedstaden, Denmark
Christian D. Damsgaard*
Affiliation:
Technical University of Denmark - Nanolab, Kgs. Lyngby, Hovedstaden, Denmark Technical University of Denmark - Physics, Kgs. Lyngby, Hovedstaden, Denmark
*
*Corresponding author: [email protected]

Abstract

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Type
Artificial Intelligence, Instrument Automation, And High-dimensional Data Analytics for Microscopy and Microanalysis
Information
Microscopy and Microanalysis , Volume 28 , Supplement S1 , August 2022 , pp. 3032 - 3034
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Copyright
Copyright © Microscopy Society of America 2022

References

Dembélé, K. et al. , ChemCatChem 13 (2021), p. 1920-1930. doi: 10.1002/cctc.202001074CrossRefGoogle Scholar
Otsu, N., IEEE Transactions on Systems, Man and Cybernetics 9 (1979), p. 62-66. doi: 10.1109/TSMC.1979.4310076CrossRefGoogle Scholar