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Artificial Neural Network for Automatic Alignment of Electron Optical Devices

Published online by Cambridge University Press:  22 July 2022

Enzo Rotunno  and
Vincenzo Grillo
Enzo Rotunno*
Affiliation:
Consiglio Nazionale delle Ricerche, Istituto NANO, Modena, Italy
Vincenzo Grillo
Affiliation:
Consiglio Nazionale delle Ricerche, Istituto NANO, Modena, Italy
*
*Corresponding author: [email protected]

Abstract

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Type
Artificial Intelligence, Instrument Automation, And High-dimensional Data Analytics for Microscopy and Microanalysis
Information
Microscopy and Microanalysis , Volume 28 , Supplement S1 , August 2022 , pp. 3010 - 3012
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Copyright
Copyright © Microscopy Society of America 2022

References

Tavabi, A. H., et al. Phys. Rev. Research, 2 (2020), 013185.CrossRefGoogle Scholar
Tavabi, A.H. et al. Phys. Rev. Lett. 126 (2021), 094802CrossRefGoogle Scholar
Ruffato, G, et al. Phys. Rev. Applied 15, (2021) 054028Google Scholar
Simonyan, K., et al. arXiv:1409.1556v6.Google Scholar
Rotunno, E., et al. Ultramicroscopy 228 (2021), 113338CrossRefGoogle Scholar
We acknowledge that this work has been conducted collaboration with Forschungszentrum Jülich, Thermofisher Scientific, and CNR-NANO personnel.Google Scholar