No CrossRef data available.
Article contents
Synthetic Data for Machine Learning and Novel Edge Detection to Measure Particle Size Distributions in TEM
Published online by Cambridge University Press: 22 July 2022
Abstract
An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
- Type
- Artificial Intelligence, Instrument Automation, And High-dimensional Data Analytics for Microscopy and Microanalysis
- Information
- Copyright
- Copyright © Microscopy Society of America 2022
References
Krizhevsky, A, Sutskever, I and Hinton, GE, Advances in Neural Information Processing Systems Journal 25 (2012), p. 84. doi:10.1145/3065386Google Scholar
Singh, A et al. , 3rd International Conference on Computing for Sustainable Global Development (2016), p. 1310.Google Scholar
Deng, J et al. , IEEE conference on computer vision and pattern recognition (2009), p. 248.Google Scholar
Lecun, Y et al. , Proceedings of the IEEE 86(11) (1998), p. 2278. doi:10.1109/5.726791.CrossRefGoogle Scholar
Osiński, B. et al. , IEEE International Conference on Robotics and Automation (2020), p. 6411.Google Scholar
Bradski, G., Dr. Dobb's Journal of Software Tools (2000).Google Scholar
Virtanen, P et al. , Nature Methods 17 (2020), p. 261, doi:10.1038/s41592-019-0686-2CrossRefGoogle Scholar
Ronneberger, O et al. , Medical Image Computing and Computer-Assisted Intervention (2015), p. 234.Google Scholar
This abstract has emanated from research conducted with the financial support of Science Foundation Ireland under grant no. 18/CRT/6049.Google Scholar
You have
Access