Microscopy and Microanalysis: Volume 28 -

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

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Microscopy and Microanalysis

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Volume 28 - April 2022

Analytical Sciences Symposia

Developments of 4D-STEM Imaging - Enabling New Materials Applications

Parallelizing py4DSTEM: 4D-STEM Analysis from Hours to Minutes

4D-STEM Characterization of Low q Scattering in Conductive Polymers Used for Li-ion Battery Anodes

Assisting Phase Unwrapping in Ptychography Through Minimal Phase Accumulation for Low Energy Electron Ptychography

Automated Grain Segmentation for Crystal Orientation mapping in 4D Scanning Transmission Electron Microscopy

Fast Ptychographic Reconstruction for Sparse Binary Ptychography Data.

Finding Optimal Imaging Parameters for Measuring Long-Range Electric Fields with 4DSTEM by Utilizing STEM Multislice Simulations

In-Situ 4D-STEM Study of Amorphous Titanium Oxide for Water Splitting Application

Strain-Engineering of Aluminum Scandium Nitride Films Grown Directly on Silicon by Utilizing a Gradient Seed Layer: Application of 4D-STEM Technique

Towards Spatial Mapping of Atomic Vibration Amplitudes in Thermoelectric Materials: Quantitative Convergent Beam Electron Diffraction (QCBED) Study of BiCuOQ (Q = S, Se, Te)

Fluctuation Cepstral STEM for Imaging Disordered Materials

4D STEM with an Ultrafast Camera Reveals Mesoscale Structure in Anisotropic Molecular Glass Thin Films

A Quantitative Understanding of the Short Range Order in Disordered Rocksalt Cathode Materials

Relaxation and Strain in Moiré Superlattices

Seeing the Structure and Structural Evolution of Nano-crystallites in Soft Materials Using 4D Scanning Confocal Electron Diffraction

Mapping Polar Distortions with Nanobeam Electron Diffraction with a Cepstral Approach

Accuracy, Reproducibility, and Calibration in 4D-STEM

Measuring Antiferromagnetism at the Angstrom Scale using 4D-STEM

Polar Nano-Domains in Barium Hexaferrite Revealed with Multislice Electron Ptychography

Quantitative Measurement of Electric Fields in Microelectronics Devices by In-Situ Pixelated STEM

Imaging Sensitive Catalyst Active Site Structure by 30 keV Electron Ptychography

Microscopy and Microanalysis

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Volume 28 - April 2022

Analytical Sciences Symposia

Developments of 4D-STEM Imaging - Enabling New Materials Applications