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4D-STEM Characterization of Low q Scattering in Conductive Polymers Used for Li-ion Battery Anodes

Published online by Cambridge University Press:  22 July 2022

Hadas Sternlicht ,
Tianyu Zhu ,
Benjamin Savitzky ,
Colin Ophus ,
Gao Liu  and
Andrew M. Minor
Hadas Sternlicht
Affiliation:
Lawrence Berkeley National Laboratory, Berkeley, California, United States
Tianyu Zhu
Affiliation:
Lawrence Berkeley National Laboratory, Berkeley, California, United States
Benjamin Savitzky
Affiliation:
Lawrence Berkeley National Laboratory, Berkeley, California, United States
Colin Ophus
Affiliation:
Lawrence Berkeley National Laboratory, Berkeley, California, United States
Gao Liu*
Affiliation:
Lawrence Berkeley National Laboratory, Berkeley, California, United States
Andrew M. Minor*
Affiliation:
Lawrence Berkeley National Laboratory, Berkeley, California, United States Department of Materials Science and Engineering, University of California, Berkeley, California, United States
*
*Corresponding authors: [email protected], [email protected]
*Corresponding authors: [email protected], [email protected]

Abstract

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Type
Developments of 4D-STEM Imaging - Enabling New Materials Applications
Information
Microscopy and Microanalysis , Volume 28 , Supplement S1 , August 2022 , pp. 428 - 429
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Copyright
Copyright © Microscopy Society of America 2022

References

Panova, O. et al. , Nature Materials 18 (2019) 860-865.CrossRefGoogle Scholar
Liu, G., et al. , Advanced Materials 23 (2011) 4679-4683.CrossRefGoogle Scholar
Zhao, H. et al. , Nano Letters 14 (2014) 6704-6710.CrossRefGoogle Scholar
Zhu, T., Liu, G., Journal of The Electrochemical Society 168 (2021) 050533.CrossRefGoogle Scholar
This work was funded by the Toyota Research Institute and by the Assistant Secretary for Energy Efficiency, Vehicle Technologies Office of the U.S. Department of Energy under the I4-Lab Program. The authors acknowledge support by the Molecular Foundry at Lawrence Berkeley National Laboratory, which is supported by the U.S. Department of Energy under Contract No. DE-AC02-05-CH11231.Google Scholar