Microscopy and Microanalysis: Volume 28 -

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Volume 28 - April 2022

Analytical Sciences Symposia

Advanced 3D Imaging and Analysis Methods for New Opportunities in Material Science

Crystal Structure and Defect Analysis of Colloidal Supraparticles by Lab-Based X-ray Microscopy

Visualizing Structural Transitions and Electric Potentials via 4DSTEM

Insight Into Precipitation Synergy of Nano β-NiAl + Cu + Carbide in Austenitic Steel by Atom-Probe Tomography

Thermal Stability of Au@Pt Nanoparticles Investigated by Electron Tomography

3D Nanoscale Imaging of Semiconductor Films for GAA (Gate All Around) Device Development

Multi-Axis Acquisition Schemes for Scalar and Vector Electron Tomography

On Demand - Advanced 3D Imaging and Analysis Methods for New Opportunities in Material Science

Synergistic Imaging of Battery Materials Using Laboratory and Synchrotron X-Ray Microscopy

X-ray Computed Tomography for Pores Evolutions Under Thermo-mechanical Loading : In Situ Characterization at Nano and Micro Scale

Cryogenic Electron Microscopy Combined with Energy-Dispersive X-ray Spectroscopy Tomography for Materials Science

From 2D and Single Particle to 3D and Batch Analysis as a Routine Quality Check Procedure for the Morphological Characterization of Core-Shell Microparticles

3D Electron Diffraction Study of Delithiation Induced Lattice Distortion in Li-rich Layered Oxide Cathode

Deterioration Mechanisms during Exposure to Humidity-Controlled Air of Argyrodite Solid Electrolytes for All-solid-state Batteries

Hollow-cone Dark Field (HCDF) Imaging for Nano-grained Mg: Experimental and Simulated Contrast

Developments of 4D-STEM Imaging - Enabling New Materials Applications

4D-STEM of Beam-Sensitive Materials

Dose-Efficient Defect Contrast with 4D-STEM

Microstructural Study of Organic Mixed Ionic-Electronic Conductor Thin Films Using 4D-STEM and HRTEM

Applications of Low Dose Electron Ptychography.

Acquisition and Analysis of Serial Electron Diffraction Data for Structure Determination

Addressing Thickness Induced Contrast Reversals in Focused Probe Ptychography

Fourier Ptychography in the TEM: Developments and Opportunities

Microscopy and Microanalysis

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Volume 28 - April 2022

Analytical Sciences Symposia

Advanced 3D Imaging and Analysis Methods for New Opportunities in Material Science

On Demand - Advanced 3D Imaging and Analysis Methods for New Opportunities in Material Science

Developments of 4D-STEM Imaging - Enabling New Materials Applications