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Fast Ptychographic Reconstruction for Sparse Binary Ptychography Data.

Published online by Cambridge University Press:  22 July 2022

Emma Hedley ,
Björn Eckert ,
Heike Soltau  and
Peter D. Nellist
Emma Hedley*
Affiliation:
Department of Materials, University of Oxford, Oxford, UK
Björn Eckert
Affiliation:
PNDetector GmbH, München, Germany
Heike Soltau
Affiliation:
PNDetector GmbH, München, Germany
Peter D. Nellist
Affiliation:
Department of Materials, University of Oxford, Oxford, UK
*
*Corresponding Author: [email protected]

Abstract

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Type
Developments of 4D-STEM Imaging - Enabling New Materials Applications
Information
Microscopy and Microanalysis , Volume 28 , Supplement S1 , August 2022 , pp. 438 - 439
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Copyright
Copyright © Microscopy Society of America 2022

References

Ryll, H et al. , J. Instrum. 11 (2016).CrossRefGoogle Scholar
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O'Leary, CM et al. , Appl. Phys. Lett. 116 (2020).CrossRefGoogle Scholar
Zhou, L et al. Nat. Commun. 11 (2020), p. 1.Google Scholar
The authors acknowledge use of characterization facilities within the David Cockayne Centre for Electron Microscopy, Department of Materials, University of Oxford and in particular the Faraday Institution (FIRG007, FIRG008), the EPSRC (EP/K040375/1 “South of England Analytical Electron Microscope”) and additional instrument provision from the Henry Royce Institute (Grant reference EP/R010145/1).Google Scholar