No CrossRef data available.
Article contents
Finding Optimal Imaging Parameters for Measuring Long-Range Electric Fields with 4DSTEM by Utilizing STEM Multislice Simulations
Published online by Cambridge University Press: 22 July 2022
Abstract
An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
- Type
- Developments of 4D-STEM Imaging - Enabling New Materials Applications
- Information
- Copyright
- Copyright © Microscopy Society of America 2022
References
Kirkland, E. J., Advanced computing in electron microscopy. Springer Science & Business Media, 2010.CrossRefGoogle Scholar
Neudeck, G. W., The PN junction diode. No. 2. Addison Wesley Publishing Company, 1983.Google Scholar
You have
Access