Hostname: page-component-78c5997874-v9fdk Total loading time: 0 Render date: 2024-11-12T21:36:07.242Z Has data issue: false hasContentIssue false
  • English
  • Français

Automated Grain Segmentation for Crystal Orientation mapping in 4D Scanning Transmission Electron Microscopy

Published online by Cambridge University Press:  22 July 2022

Daniel Zeitler ,
Ehsan Nikbin ,
Jonathan Kong ,
Robert A. McLeod ,
R. J. Dwayne Miller ,
Roger C. Newman ,
Jane Y. Howe  and
Doug Perovic
Daniel Zeitler
Affiliation:
Department of Materials Science & Engineering, University of Toronto, Toronto, ON, Canada
Ehsan Nikbin
Affiliation:
Department of Materials Science & Engineering, University of Toronto, Toronto, ON, Canada
Jonathan Kong
Affiliation:
Department of Materials Science & Engineering, University of Toronto, Toronto, ON, Canada
Robert A. McLeod
Affiliation:
Hitachi High-Tech Canada Inc., Toronto, ON, Canada
R. J. Dwayne Miller
Affiliation:
Department of Chemistry, University of Toronto, Toronto, ON, Canada
Roger C. Newman
Affiliation:
Department of Chemical Engineering & Applied Chemistry, University of Toronto, Toronto, ON, Canada
Jane Y. Howe
Affiliation:
Department of Materials Science & Engineering, University of Toronto, Toronto, ON, Canada Department of Chemical Engineering & Applied Chemistry, University of Toronto, Toronto, ON, Canada
Doug Perovic
Affiliation:
Department of Materials Science & Engineering, University of Toronto, Toronto, ON, Canada

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Developments of 4D-STEM Imaging - Enabling New Materials Applications
Information
Microscopy and Microanalysis , Volume 28 , Supplement S1 , August 2022 , pp. 434 - 436
Check for updates
Copyright
Copyright © Microscopy Society of America 2022

References

Wu, L, Meng, Q and Zhu, Y, Ultramicroscopy 219 (2020), p. 113095.CrossRefGoogle Scholar
Mu, X et al. , Microscopy 68(4) (2019), p. 301.CrossRefGoogle Scholar
Mehta, AN et al. , Nanotechnology 31(44) (2020), p. 445702.CrossRefGoogle Scholar
Ophus, C, Microscopy and Microanalysis 25(3) (2019), p. 563.CrossRefGoogle Scholar
Savitzky, BH et al. , Microscopy and Microanalysis 27(4) (2021), p. 712.CrossRefGoogle Scholar
We thank the support by the Natural Sciences and Engineering Research Council (NSERC) of Canada, as well as the use of the Open Centre for the Characterization of Advanced Materials (OCCAM). The authors have contributed equally to this work.Google Scholar