Microscopy and Microanalysis: Volume 26 -

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Volume 26 - December 2020

New Frontiers in Electron Microscopy of Two-dimensional Materials

Atomic Scale Structure and Chemistry Study of Franckeite - A Natural van-der-Waals Heterostructure - Using Scanning Transmission Electron Microscopy and Atom Probe Tomography

Comprehensive S/TEM Study of Interfaces in CVD Grown Vertical and In-plane Heterostructures of Two-Dimensional MoS2 and ReS2

Energy and Soft Materials and the Development of Cryogenic Techniques for Studying Them

Advances in Cryo-Electron Microscopy for Understanding Energy Materials

Cryo-EM of Li Metal Battery Aging and Failure Mechanisms

Cryo-STEM-EDX for Reliable Characterization of Sulfur Distribution and the Rational Design of Sulfur Hosts for Li-S Batteries

Stabilizing Fuel Cell Materials Through Cryogenic Cooling for Simultaneous EELS-EDS Analysis

Advanced Characterization of Nuclear Fuels and Materials

Advanced FIB/SEM Characterization of Nuclear Materials in the Irradiated Materials Characterization Lab

Probing the Unique Radiation Damage Response of Oxide Interfaces Using Multi-modal STEM Imaging, Diffraction, and Spectroscopy

Characterizing Zircaloy-4 Corrosion Films Formed Under Neutron Irradiation Using Focused Ion Beam Tomography

In Situ TEM at the Extremes - Corrosion

In-situ Atomic-scale Imaging of Unidirectional Oxide Growth During the Oxidation of Metals

In Situ Atomic Scale ETEM Observation of Oxide Nucleation and Growth During Initial Oxidation of Cu and Cu-Ni Alloy

In Situ Study of Cu Oxidation in gas environment

In-situ Oxidation State Mapping by Electron Energy-loss Spectroscopy

In-situ Atomic-Resolution Observations of Surface Passivation Induced Metal/Oxide Interfacial Transformation

FIB-SEM Technology and Electron Tomography for Materials Science and Engineering

Three-dimensional Analysis of Materials at Multiple Length Scales

Controlled Self-organization on Germanium Using Focused Ion Beam (FIB): From Quasi-periodic Nanoripples to Well-ordered Periodic Nanostructures

3D Characterization of a Novel CoNi-superalloy for Additive Manufacturing

Focused Ion Beam Surface Preparation for Plasma Facing Materials

Approaching Operando Imaging of Functional Materials

Atomic-resolution Operando and Time-resolved In Situ TEM Imaging of Oxygen Transfer Reactions Catalyzed by CeO2-supported Pt Nanoparticles

Operando S/TEM Reactions of Pt/TiO2 Catalysts for Catalytic Fast Pyrolysis

Microscopy and Microanalysis

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Volume 26 - December 2020

New Frontiers in Electron Microscopy of Two-dimensional Materials

Energy and Soft Materials and the Development of Cryogenic Techniques for Studying Them

Advanced Characterization of Nuclear Fuels and Materials

In Situ TEM at the Extremes - Corrosion

FIB-SEM Technology and Electron Tomography for Materials Science and Engineering

Approaching Operando Imaging of Functional Materials