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In-situ Atomic-Resolution Observations of Surface Passivation Induced Metal/Oxide Interfacial Transformation

Published online by Cambridge University Press:  30 July 2020

Xiaobo Chen ,
Dongxiang Wu ,
Xianhu Sun ,
Dmitri Zakharov ,
Sooyeon Hwang ,
Dong Su  and
Guangwen Zhou
Xiaobo Chen
Affiliation:
SUNY Binghamton University, Binghamton, New York, United States
Dongxiang Wu
Affiliation:
SUNY Binghamton University, Binghamton, New York, United States
Xianhu Sun
Affiliation:
SUNY Binghamton University, Binghamton, New York, United States
Dmitri Zakharov
Affiliation:
Brookhaven National Laboratory, Upton, New York, United States
Sooyeon Hwang
Affiliation:
Brookhaven National Laboratory, Upton, New York, United States
Dong Su
Affiliation:
Brookhaven National Laboratory, Upton, New York, United States
Guangwen Zhou
Affiliation:
SUNY Binghamton University, Binghamton, New York, United States

Abstract

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Type
In Situ TEM at the Extremes - Corrosion
Information
Microscopy and Microanalysis , Volume 26 , Supplement S2 , August 2020 , pp. 1678 - 1679
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Copyright
Copyright © Microscopy Society of America 2020

References

Zhou, G., Acta Mater. 57, 4432 (2009)10.1016/j.actamat.2009.06.005CrossRefGoogle Scholar
Zhou, G., Appl. Phys. Lett. 94, 233115 (2009)10.1063/1.3154546CrossRefGoogle Scholar
This work was supported by the U.S. Department of Energy, Office of Basic Energy Sciences, Division of Materials Sciences and Engineering under Award No. DE-SC0001135. This research used resources of the Center for Functional Nanomaterials, which is a U.S. DOE Office of Science Facility, at Brookhaven National Laboratory under Contract No. DE-SC0012704.Google Scholar