Methods and Applications in Localization-Based Super-Resolution Microscopy
Single Molecule Localization Microscopy at Janelia's Advanced Imaging Center
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- 30 July 2020, pp. 1584-1585
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High Precision 3D Single Molecule Microscopy Using the Double Helix Point Spread Function
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- 30 July 2020, pp. 1586-1589
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Single-molecule Tracking Reveals Multi-state Dynamics of a Bacterial DNA Methyltransferase in Vivo
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- 30 July 2020, pp. 1590-1591
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Correlative and Multimodal Microscopy and Imaging of Physical, Environmental, and Biological Sciences
Challenges and Solutions in the Characterization of Hierarchically Structured, Functionally Graded Tooth Biominerals
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- 30 July 2020, pp. 1592-1594
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Novel Class of Probes for Multimodal Microscopy of Cells
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- 30 July 2020, pp. 1596-1597
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High-precision Cryogenic Correlative Light and Electron Microscopy Using Two Independent Alignment Features and an Easy-to-use Toolkit to Study Virus-infected Mammalian Cells
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- 30 July 2020, pp. 1598-1601
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Correlated Imaging of Topology and Composition Within Phase-separated Supported Lipid Membranes
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- 30 July 2020, pp. 1602-1603
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Biomedical and Pharmaceutical Research on the Development, Diagnosis, Prevention, and Treatment of Diseases
Computational Optics of the Collagen Rich Tumor Microenvironment
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- 30 July 2020, p. 1604
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Deep Learning Convolutional Neural Networks for Pharmaceutical Tablet Defect Detection
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- 30 July 2020, pp. 1606-1609
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Electron Microscopy in the Context of a Children's Research Hospital
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- 30 July 2020, pp. 1610-1611
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Image Processing Developments in Cryo-EM
New Techniques to Address Asymmetry in 3D Structure Analysis of Helical Biofilaments Imaged by Cryo-EM
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- 30 July 2020, p. 1612
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From Static Structures to Continuous Conformational Changes on the Energy Landscapes
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- 30 July 2020, pp. 1614-1615
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A Complete Workflow for Subnanometer Resolution Subtomogram Averaging In Situ
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- 30 July 2020, p. 1616
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Advances in Electron Microscopy to Characterize Materials Embedded in Devices
Probing Device-relevant Defects in van der Waals Layered Materials
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- 30 July 2020, pp. 1618-1619
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A Robust Basis for Grain Identification in Polycrystalline Thin Film Devices Using Cepstrum Transforms of 4D-STEM Diffraction Pattern
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- 30 July 2020, pp. 1620-1622
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Beam Damage by Transmission Electron Microscopy in FinFet Structures
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- 30 July 2020, pp. 1624-1625
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Nanosized Field-effect Transistor Based on Germanium for Next Generation Biosensors in Scanning Ion-conductance Microscopy
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- 30 July 2020, pp. 1626-1628
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New Frontiers in Electron Microscopy of Two-dimensional Materials
Uncovering Atomic and Nano-scale Deformations in Two-dimensional Lateral Heterojunctions
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- 30 July 2020, pp. 1630-1631
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Probing the Intrinsic Bending Stiffness of 2D Multilayers and Heterostructures Using Aberration-corrected STEM
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- 30 July 2020, pp. 1632-1634
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Atomic Structure and Dynamics of Defects and Grain Boundaries in 2D Pd2Se3 Monolayers
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- 30 July 2020, pp. 1636-1640
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