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Comprehensive S/TEM Study of Interfaces in CVD Grown Vertical and In-plane Heterostructures of Two-Dimensional MoS2 and ReS2

Published online by Cambridge University Press:  30 July 2020

Saiphaneendra Bachu ,
Lauren Stanton ,
Chenhao Qian ,
Danielle Reifsnyder Hickey  and
Nasim Alem
Saiphaneendra Bachu
Affiliation:
Pennsylvania State University, State College, Pennsylvania, United States
Lauren Stanton
Affiliation:
Pennsylvania State University, University Park, Pennsylvania, United States
Chenhao Qian
Affiliation:
Pennsylvania State University, University Park, Pennsylvania, United States
Danielle Reifsnyder Hickey
Affiliation:
Pennsylvania State University, State College, Pennsylvania, United States
Nasim Alem
Affiliation:
Pennsylvania State University, University Park, Pennsylvania, United States

Abstract

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Type
New Frontiers in Electron Microscopy of Two-dimensional Materials
Information
Microscopy and Microanalysis , Volume 26 , Supplement S2 , August 2020 , pp. 1644 - 1646
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Copyright
Copyright © Microscopy Society of America 2020

References

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This work was supported by the National Science Foundation (NSF), in part under the CAREER program (DMR-1654107), in part by the program EFRI 2-DARE: 2D Crystals by Activated Atomic Layer Deposition (EFRI-1433378), and in part by the Penn State 2D Crystal Consortium-Materials Innovation Platform (2DCC-MIP) under NSF cooperative agreement DMR-1539916.Google Scholar