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Three-dimensional Analysis of Materials at Multiple Length Scales

Published online by Cambridge University Press:  30 July 2020

Joshua Sugar
Affiliation:
Sandia National Laboratories, Livermore, California, United States
Norm Bartelt
Affiliation:
Sandia National Laboratories, Livermore, California, United States
David Robinson
Affiliation:
Sandia National Laboratories, Livermore, California, United States
Bonnie Antoun
Affiliation:
Sandia National Laboratories, Livermore, California, United States
Chris San Marchi
Affiliation:
Sandia National Laboratories, Livermore, California, United States
Thale Smith
Affiliation:
Sandia National Laboratories, Livermore, California, United States
Coleman Alleman
Affiliation:
Sandia National Laboratories, Livermore, California, United States
Hanping Ding
Affiliation:
Idaho National Laboratory, Idaho Falls, Idaho, United States
Dong Ding
Affiliation:
Idaho National Laboratory, Idaho Falls, Idaho, United States
Suzy Vitale
Affiliation:
Canegie Institution for Science, Washington DC, District of Columbia, United States

Abstract

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Type
FIB-SEM Technology and Electron Tomography for Materials Science and Engineering
Copyright
Copyright © Microscopy Society of America 2020

References

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Sandia National Laboratories is a multimission laboratory managed and operated by National Technology & Engineering Solutions of Sandia, LLC, a wholly owned subsidiary of Honeywell International Inc., for the U.S. Department of Energy's National Nuclear Security Administration under contract DE-NA0003525. This paper describes objective technical results and analysis. Any subjective views or opinions that might be expressed in the paper do not necessarily represent the views of the U.S. Department of Energy or the United States Government.Google Scholar