No CrossRef data available.
Article contents
Three-dimensional Analysis of Materials at Multiple Length Scales
Published online by Cambridge University Press: 30 July 2020
Abstract
An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
- Type
- FIB-SEM Technology and Electron Tomography for Materials Science and Engineering
- Information
- Copyright
- Copyright © Microscopy Society of America 2020
References
Burnett, T., Winiarski, B., Kelly, R., Zhong, X., Boona, I., McComb, D., Microscopy Today, 24 (2016) 32–39.10.1017/S1551929516000316CrossRefGoogle Scholar
Catarineu, N.R., Bartelt, N.C., Sugar, J.D., Vitale, S.M., Shanahan, K.L., Robinson, D.B., The Journal of Physical Chemistry C, 123 (2019) 19142–19152.10.1021/acs.jpcc.9b00709CrossRefGoogle Scholar
Gao, Y., Neal, L., Ding, D., Wu, W., Baroi, C., Gaffney, A.M., Li, F., ACS Catalysis, 9 (2019) 8592–8621.10.1021/acscatal.9b02922CrossRefGoogle Scholar
Smith, T.R., Sugar, J.D., San Marchi, C., Schoenung, J.M., Acta Materialia, 164 (2019) 728–740.10.1016/j.actamat.2018.11.021CrossRefGoogle Scholar
Babu, R.P., Irukuvarghula, S., Harte, A., Preuss, M., Acta Mater, 120 (2016) 391–402.10.1016/j.actamat.2016.08.008CrossRefGoogle Scholar
Basa, A., Thaulow, C., Barnoush, A., Metall Mater Trans A, 45a (2014) 1189–1198.10.1007/s11661-013-2101-4CrossRefGoogle Scholar
Sandia National Laboratories is a multimission laboratory managed and operated by National Technology & Engineering Solutions of Sandia, LLC, a wholly owned subsidiary of Honeywell International Inc., for the U.S. Department of Energy's National Nuclear Security Administration under contract DE-NA0003525. This paper describes objective technical results and analysis. Any subjective views or opinions that might be expressed in the paper do not necessarily represent the views of the U.S. Department of Energy or the United States Government.Google Scholar
You have
Access