Approaching Operando Imaging of Functional Materials
Microstructural Characterization on AISI 4140 Steel Boriding by New and Reused Dehydrated Boron Paste
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- 30 July 2020, pp. 1462-1463
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In Situ Microscopy Study of ZnO Acid Etching Nanostructures
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- 30 July 2020, pp. 1464-1466
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Advances in Modeling, Simulation, and Artificial Intelligence in Microscopy and Microanalysis for Physical and Biological Systems
Forget About Cleaning up Your Micrographs: Deep Learning Segmentation is Robust to Image Artifacts
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- 30 July 2020, pp. 1468-1469
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Component Detection and Evaluation Framework (CDEF): A Semantic Annotation Tool
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- 30 July 2020, pp. 1470-1474
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Architecture Optimization and Interpretability in Neural Networks for HRTEM Segmentation
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- 30 July 2020, pp. 1476-1477
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Making Image Analysis Easier with Machine Learning: A Foam Cell Size Study
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- 30 July 2020, pp. 1478-1480
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Four-dimensional Scanning Transmission Electron Microscopy (4D-STEM): New Experiments and Data Analyses for Determining Materials Functionality and Biological Structures
Dose-Efficient Cryo-STEM Imaging of Vitrified Biological Samples
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- 30 July 2020, pp. 1482-1483
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Assessing the Structure-property Relationship in Enamel at the Nanoscale Using 4D-STEM
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- 30 July 2020, pp. 1484-1486
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Low Dose Electron Ptychography for Cryo-biological Imaging
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- 30 July 2020, pp. 1488-1490
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Applications of Momentum-resolved Scanning Transmission Electron Microscopy for Cryo-preserved Radiation Sensitive Materials
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- 30 July 2020, p. 1492
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Impact of Recent Advancement in Instrumentation/Detectors on Electron Energy Loss Spectroscopy for Physical and Biological Sciences
Exploring Phononic and Photonic Excitations with Monochromated STEM EELS
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- 30 July 2020, pp. 1494-1496
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Strong Phonon-Plasmon Coupling Between Nanoscale Antennas
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- 30 July 2020, pp. 1498-1500
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Combining Highly Monochromatized EELS with CL for Probing Elementary Excitations and Their Interaction
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- 30 July 2020, pp. 1502-1504
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Pushing the Limits of Detection in Quantitative (S)TEM Imaging, EELS, and EDX
Temperature Dependence of Impurity Distributions in Nanodiamonds as Revealed by Coordinated UHV-STEM EDX and EELS Analysis
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- 30 July 2020, pp. 1506-1507
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Sub-Ångstrom EDX Mapping Enabled by a High-brightness Cold Field Emission Source
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- 30 July 2020, pp. 1508-1511
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Evaluation of Confocal X-ray Analysis for Single-Atom Detection in a Thin Specimen by an Advanced Analytical Electron Microscope
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- 30 July 2020, pp. 1512-1514
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Accessing Atomic-scale Phosphorus Dopant Distribution in Precise Silicon Devices by Advanced STEM Imaging and Spectroscopy
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- 30 July 2020, pp. 1516-1517
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Sensitivity and Figure of Merit Measurements of EELS vs XEDS in the Analytical Electron Microscope
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- 30 July 2020, pp. 1518-1521
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Crystallography at the Nanoscale and MicroED with Electrons and X-rays
Structural Characterization of Beam Sensitive Pharmaceutical Compounds Using 3D Electron Diffraction-Micro-ED at Low Dose with Pixelated Detectors
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- 30 July 2020, p. 1522
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Sub-Ångström-resolution MicroED Using a Direct Detection Camera
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- 30 July 2020, pp. 1524-1526
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