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Focused Ion Beam Surface Preparation for Plasma Facing Materials

Published online by Cambridge University Press:  30 July 2020

Daniel Morrall  and
Chad Parish
Daniel Morrall
Affiliation:
Oak Ridge National Lab, Oak Ridge, Tennessee, United States
Chad Parish
Affiliation:
Oak Ridge National Lab, Oak Ridge, Tennessee, United States

Abstract

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Type
FIB-SEM Technology and Electron Tomography for Materials Science and Engineering
Information
Microscopy and Microanalysis , Volume 26 , Supplement S2 , August 2020 , pp. 1692 - 1693
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Copyright
Copyright © Microscopy Society of America 2020

References

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Ziegler, J.F., Biersack, J.P., Ziegler, M.D.. The stopping and range of ions in matter. Lulu press. Ver. 7 (2008)Google Scholar
Research supported by US Department of Energy, Office of Science, Fusion Energy Sciences (including an Early Career Award), under contract number DE-AC05-00OR22725. RPD and MJW supported by DOE grant number: DE-FG02-07ER54912Google Scholar