Microscopy and Microanalysis: Volume 16 -

Quantitative Soft X-ray Microscopy of Soft Matter
H Ade
Published online by Cambridge University Press:

01 August 2010, pp. 888-889
- Article
- - You have access
- PDF
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

X–Ray Imaging Spectroscopy Using an NTD Ge-Based Microcalorimeter: An Interdisciplinary Spin-Off from Astrophysics Research
E Silver, C Gilpin, E Vicenzi, T Lin, J Beeman, E Haller
Published online by Cambridge University Press:

01 August 2010, pp. 890-891
- Article
- - You have access
- PDF
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Event-Streamed Spectral Imaging in an Aberration-Corrected AEM: A Robust Approach to High Spatial Resolution XEDS Elemental Mapping
A Herzing, IM Anderson, M Anderson
Published online by Cambridge University Press:

01 August 2010, pp. 892-893
- Article
- - You have access
- PDF
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Advances in Defocused-Beam Analysis and Compositional Mapping with the Electron-Probe Microanalyzer
P Carpenter, R Zeigler, B Jolliff
Published online by Cambridge University Press:

01 August 2010, pp. 894-895
- Article
- - You have access
- PDF
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Phosphorus and Other Impurities in Australian Iron Ores
CM MacRae, NC Wilson, M Pownceby, P Miller
Published online by Cambridge University Press:

01 August 2010, pp. 896-897
- Article
- - You have access
- PDF
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

High Speed and Very Large pnCCDs for X-ray and Electron Imaging
H Soltau, S Bjeoumikhova, R Eckhardt, R Hartmann, P Holl, S Ihle, M Lang, N Langhoff, A Liebel, A Niculae, G Schaller, F Schopper, C Thamm, A Ziegler, L Strüder
Published online by Cambridge University Press:

01 August 2010, pp. 898-899
- Article
- - You have access
- PDF
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Hard X-ray Nanoprobe Characterization of Advanced Materials
V Rose, M Holt, R Winarski, J Maser
Published online by Cambridge University Press:

01 August 2010, pp. 900-901
- Article
- - You have access
- PDF
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Subsurface Analysis of Oil Paintings by Means of Scanning Macro-XRF
K Janssens, M Alfeld, J Dik, K Rickers
Published online by Cambridge University Press:

01 August 2010, pp. 902-903
- Article
- - You have access
- PDF
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Micro-Focus X-Ray Fluorescence (µ-XRF) as an Extension of the Analytical SEM
V-D Hodoroaba, V Rackwitz, D Reuter
Published online by Cambridge University Press:

01 August 2010, pp. 904-905
- Article
- - You have access
- PDF
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Multivariate Statistics in Microanalysis: From Abstract to Useful
JH Scott, J Davis
Published online by Cambridge University Press:

01 August 2010, pp. 906-907
- Article
- - You have access
- PDF
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Developing an X-ray Imaging Strategy
J Davis, JH Scott, N Ritchie
Published online by Cambridge University Press:

01 August 2010, pp. 908-909
- Article
- - You have access
- PDF
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Imaging with Milli-XRF Benchtop Instrumentation
BE Scruggs, RW Anderhalt, LI Herczeg, A Lee
Published online by Cambridge University Press:

01 August 2010, pp. 910-911
- Article
- - You have access
- PDF
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Ultra-fast and Sensitive Element Distribution Measurement Using µ-XRF
M Haschke, U Rosseck, R Tagle, U Waldschläger, H Wagenknecht
Published online by Cambridge University Press:

01 August 2010, pp. 912-913
- Article
- - You have access
- PDF
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Comparison of SDD/WDS/Micro-XRF Element Mapping Methods Using a Garnet Schist Example
C Schwandt
Published online by Cambridge University Press:

01 August 2010, pp. 914-915
- Article
- - You have access
- PDF
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Post Processing of X-Ray Maps - Theoretical BSE Mapping, Totals Mapping and Ratio Mapping
K Moran, R Wuhrer
Published online by Cambridge University Press:

01 August 2010, pp. 916-917
- Article
- - You have access
- PDF
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Quantitative Phase Analysis of Martian Meteorite Alteration
E Vicenzi, M Velbel
Published online by Cambridge University Press:

01 August 2010, pp. 918-919
- Article
- - You have access
- PDF
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Visualizing Low Contrast Compositional Microstructures with SDD-EDS X-ray Spectrum Imaging in the Scanning Electron Microscope
D Newbury
Published online by Cambridge University Press:

01 August 2010, pp. 920-921
- Article
- - You have access
- PDF
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Combined STEM/STXM Elemental Quantification for Cometary Particles
Z Gainsforth, A Butterworth, R Ogliore, A Westphal, T Tyliszczak
Published online by Cambridge University Press:

01 August 2010, pp. 922-923
- Article
- - You have access
- PDF
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Improving Sensitivity in Soft X-ray STXM Using Low Energy X-ray Fluorescence
AP Hitchcock, T Tyliszczak, M Obst, G Swerhone, J Lawrence
Published online by Cambridge University Press:

01 August 2010, pp. 924-925
- Article
- - You have access
- PDF
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Coordinated XANES, TEM and SIMS Analysis of the Chemistry, Microstructure and Isotopic Composition of Insoluble Organics in Meteorites
R Stroud, B De Gregorio, T Zega, N Bassim, L Nittler, C Alexander, G Cody, ALD Kilcoyne
Published online by Cambridge University Press:

01 August 2010, pp. 926-927
- Article
- - You have access
- PDF
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Microscopy and Microanalysis

Refine listing

Actions for selected content:

Volume 16 - July 2010

Instrumentation and Techniques Symposia

Compositional X-ray Imaging

Abstract

Quantitative Soft X-ray Microscopy of Soft Matter

X–Ray Imaging Spectroscopy Using an NTD Ge-Based Microcalorimeter: An Interdisciplinary Spin-Off from Astrophysics Research

Event-Streamed Spectral Imaging in an Aberration-Corrected AEM: A Robust Approach to High Spatial Resolution XEDS Elemental Mapping

Advances in Defocused-Beam Analysis and Compositional Mapping with the Electron-Probe Microanalyzer

Phosphorus and Other Impurities in Australian Iron Ores

High Speed and Very Large pnCCDs for X-ray and Electron Imaging

Hard X-ray Nanoprobe Characterization of Advanced Materials

Subsurface Analysis of Oil Paintings by Means of Scanning Macro-XRF

Micro-Focus X-Ray Fluorescence (µ-XRF) as an Extension of the Analytical SEM

Multivariate Statistics in Microanalysis: From Abstract to Useful

Developing an X-ray Imaging Strategy

Imaging with Milli-XRF Benchtop Instrumentation

Ultra-fast and Sensitive Element Distribution Measurement Using µ-XRF

Comparison of SDD/WDS/Micro-XRF Element Mapping Methods Using a Garnet Schist Example

Post Processing of X-Ray Maps - Theoretical BSE Mapping, Totals Mapping and Ratio Mapping

Quantitative Phase Analysis of Martian Meteorite Alteration

Visualizing Low Contrast Compositional Microstructures with SDD-EDS X-ray Spectrum Imaging in the Scanning Electron Microscope

Combined STEM/STXM Elemental Quantification for Cometary Particles

Improving Sensitivity in Soft X-ray STXM Using Low Energy X-ray Fluorescence

Coordinated XANES, TEM and SIMS Analysis of the Chemistry, Microstructure and Isotopic Composition of Insoluble Organics in Meteorites

Microscopy and Microanalysis

Refine listing

Actions for selected content:

Save Search

Volume 16 - July 2010

Instrumentation and Techniques Symposia

Compositional X-ray Imaging

Abstract