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Micro-Focus X-Ray Fluorescence (µ-XRF) as an Extension of the Analytical SEM

Published online by Cambridge University Press:  01 August 2010

V-D Hodoroaba ,
V Rackwitz  and
D Reuter
V-D Hodoroaba
Affiliation:
BAM Federal Institute for Materials Research & Testing, Germany
V Rackwitz
Affiliation:
BAM Federal Institute for Materials Research & Testing, Germany
D Reuter
Affiliation:
BAM Federal Institute for Materials Research & Testing, Germany

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 16 , Supplement S2 , July 2010 , pp. 904 - 905
Copyright
Copyright © Microscopy Society of America 2010