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High Speed and Very Large pnCCDs for X-ray and Electron Imaging

Published online by Cambridge University Press:  01 August 2010

H Soltau ,
S Bjeoumikhova ,
R Eckhardt ,
R Hartmann ,
P Holl ,
S Ihle ,
M Lang ,
N Langhoff ,
A Liebel  and
A Niculae
...Show all authors
H Soltau
Affiliation:
PNSensor GmbH, Germany
S Bjeoumikhova
Affiliation:
IFG GmbH, Germany
R Eckhardt
Affiliation:
PNSensor GmbH, Germany
R Hartmann
Affiliation:
PNSensor GmbH, Germany
P Holl
Affiliation:
PNSensor GmbH, Germany
S Ihle
Affiliation:
PNSensor GmbH, Germany
M Lang
Affiliation:
PNSensor GmbH, Germany
N Langhoff
Affiliation:
IFG GmbH, Germany
A Liebel
Affiliation:
PNDetector GmbH, Germany
A Niculae
Affiliation:
PNDetector GmbH, Germany
G Schaller
Affiliation:
MPI Halbleiterlabor, Germany
F Schopper
Affiliation:
MPI Halbleiterlabor, Germany
C Thamm
Affiliation:
PNSensor GmbH, Germany
A Ziegler
Affiliation:
MPI Halbleiterlabor, Germany
L Strüder
Affiliation:
MPI Halbleiterlabor, Germany

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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 16 , Supplement S2 , July 2010 , pp. 898 - 899
Copyright
Copyright © Microscopy Society of America 2010