Microscopy and Microanalysis: Volume 16 -

Crystallographic characterization of polycrystalline materials: High resolution automated crystallite orientation & phase mapping and Precession electron diffraction ring patterns
S Rouvimov, P Moeck, E Rauch, Y Maniette, D Bultreys
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01 August 2010, pp. 768-769
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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Improving angular resolution of the crystal orientation determined with spot diffraction patterns
E Rauch, M Véron
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01 August 2010, pp. 770-771
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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Mineshaft Roller Bearing Failure Analysis
RJ Parrington, DM Christie
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01 August 2010, pp. 772-773
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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Revealing Prior-Austenite Grain Boundaries
GF Vander Voort
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01 August 2010, pp. 774-775
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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Hydrogen Effects on the Failure Mechanisms in Fe-Ni Weldments
JA Fenske, IM Robertson, R Ayer, M Hukle, D Lillig, B Newbury
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01 August 2010, pp. 776-777
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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Multi-scale Investigation of the Hydrogen-Assisted Failure of X65 Pipeline Steel
M Martin, IM Robertson, B Somerday, C San Marchi, P Sofronis
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01 August 2010, pp. 778-779
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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Analysis of a Spiral/Spliced Pipe Weld Hydrostatic Test Rupture
JL McDougall, FE Schmidt, Jr, ME Stevenson
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01 August 2010, pp. 780-781
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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Refraction-Assisted Illumination for Infrared Imaging of Integrated Circuits
S LaLumondiere, T Yeoh
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01 August 2010, pp. 782-783
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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Correlative Light and Electron Microscopy (CLEM) for Characterization of Lithium Ion Battery Materials
C Thomas, M Edelmann, D Lysenkov, C Hafner, T Bernthaler, G Schneider
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01 August 2010, pp. 784-785
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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Role of Microscopy and Microanalysis in Friction Stir Weld Development
M Fischer
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01 August 2010, pp. 786-787
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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Stress Corrosion Behavior of an Aluminum-Lithium Alloy
AA Frefer
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01 August 2010, pp. 788-789
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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Special Approaches to Metallography for Zirconium & Other Reactive Metals
SD Sparkowich
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01 August 2010, pp. 790-791
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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Tin Whiskers: Electron Microscopy and EBSD Characterization
DF Susan, JR Michael, RP Grant, WG Yelton
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01 August 2010, pp. 792-793
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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Electron Beam Induced Current Characterization of Dark Line Defects in Failed and Degraded High Power Quantum Well Laser Diodes
M Mason, N Presser, Y Sin, B Foran, SC Moss
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01 August 2010, pp. 794-795
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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Corrosion Damage of Copper Tubes
M Panzenböck
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01 August 2010, pp. 796-797
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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Role of Microscopy in Advanced Semiconductor Failure Analysis
XT Tong, L Pan, B Miner, K Johnson, S Subramaniam, M Sacks
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01 August 2010, pp. 798-799
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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Characterization of Localized Degradation in Reverse-Biased GaN HEMTs by Scanning Transmission Electron Microscopy and Electron Holography
DA Cullen, DJ Smith, A Stocco, G Meneghesso, E Zanoni, MR McCartney
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01 August 2010, pp. 800-801
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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Cathodoluminescence Study of Actinide Oxides
A Neuman, C Davis, T Nothwang, W Duncan, F Hampel, S Wilson
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01 August 2010, pp. 802-803
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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

An X-Ray and Cathodoluminescence Study of Cassiterite (SnO2)
S Wight, E Vicenzi, D Meier, K Benkstein
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01 August 2010, pp. 804-805
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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Analyses of Semiconductor Materials by Spectrometric Full-color Cathodoluminescence Microscopy
H Saijo, Y Suzuki, M Shiojiri
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01 August 2010, pp. 806-807
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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

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Volume 16 - July 2010

Instrumentation and Techniques Symposia

Image Analysis & Quantitative Microscopy

Abstract

Crystallographic characterization of polycrystalline materials: High resolution automated crystallite orientation & phase mapping and Precession electron diffraction ring patterns

Improving angular resolution of the crystal orientation determined with spot diffraction patterns

Failure Analysis: Practical Microscopy, Metallography and Fractography from Real World Applications or Research Case Studies

Abstract

Mineshaft Roller Bearing Failure Analysis

Revealing Prior-Austenite Grain Boundaries

Hydrogen Effects on the Failure Mechanisms in Fe-Ni Weldments

Multi-scale Investigation of the Hydrogen-Assisted Failure of X65 Pipeline Steel

Analysis of a Spiral/Spliced Pipe Weld Hydrostatic Test Rupture

Refraction-Assisted Illumination for Infrared Imaging of Integrated Circuits

Correlative Light and Electron Microscopy (CLEM) for Characterization of Lithium Ion Battery Materials

Role of Microscopy and Microanalysis in Friction Stir Weld Development

Stress Corrosion Behavior of an Aluminum-Lithium Alloy

Special Approaches to Metallography for Zirconium & Other Reactive Metals

Tin Whiskers: Electron Microscopy and EBSD Characterization

Electron Beam Induced Current Characterization of Dark Line Defects in Failed and Degraded High Power Quantum Well Laser Diodes

Corrosion Damage of Copper Tubes

Role of Microscopy in Advanced Semiconductor Failure Analysis

Characterization of Localized Degradation in Reverse-Biased GaN HEMTs by Scanning Transmission Electron Microscopy and Electron Holography

Scanning Cathodoluminescence Microscopy and Spectroscopy: New Developments and Applications

Abstract

Cathodoluminescence Study of Actinide Oxides

An X-Ray and Cathodoluminescence Study of Cassiterite (SnO2)

Analyses of Semiconductor Materials by Spectrometric Full-color Cathodoluminescence Microscopy

Microscopy and Microanalysis

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Volume 16 - July 2010

Instrumentation and Techniques Symposia

Image Analysis & Quantitative Microscopy

Abstract

Failure Analysis: Practical Microscopy, Metallography and Fractography from Real World Applications or Research Case Studies

Abstract

Scanning Cathodoluminescence Microscopy and Spectroscopy: New Developments and Applications

Abstract