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Improving Sensitivity in Soft X-ray STXM Using Low Energy X-ray Fluorescence

Published online by Cambridge University Press:  01 August 2010

AP Hitchcock ,
T Tyliszczak ,
M Obst ,
G Swerhone  and
J Lawrence
AP Hitchcock
Affiliation:
McMaster University, Canada
T Tyliszczak
Affiliation:
Lawrence Berkeley National Laboratory
M Obst
Affiliation:
Eberhard Karls University Tuebingen, Germany
G Swerhone
Affiliation:
National Water Research Institute
J Lawrence
Affiliation:
National Water Research Institute

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 16 , Supplement S2 , July 2010 , pp. 924 - 925
Copyright
Copyright © Microscopy Society of America 2010