Advances in Defocused-Beam Analysis and Compositional Mapping with the Electron-Probe Microanalyzer

P Carpenter; R Zeigler; B Jolliff

doi:10.1017/S1431927610054255

Advances in Defocused-Beam Analysis and Compositional Mapping with the Electron-Probe Microanalyzer

Published online by Cambridge University Press: 01 August 2010

P Carpenter ,

R Zeigler and

B Jolliff

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P Carpenter: Affiliation:
Washington University in St Louis
R Zeigler: Affiliation:
Washington University in St Louis
B Jolliff: Affiliation:
Washington University in St Louis

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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Type: Abstract
Information: Microscopy and Microanalysis , Volume 16 , Supplement S2 , July 2010 , pp. 894 - 895

DOI: https://doi.org/10.1017/S1431927610054255 [Opens in a new window]

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Advances in Defocused-Beam Analysis and Compositional Mapping with the Electron-Probe Microanalyzer

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