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Ultra-fast and Sensitive Element Distribution Measurement Using µ-XRF

Published online by Cambridge University Press:  01 August 2010

M Haschke ,
U Rosseck ,
R Tagle ,
U Waldschläger  and
H Wagenknecht
M Haschke
Affiliation:
Bruker Nano GmbH
U Rosseck
Affiliation:
Bruker Nano GmbH
R Tagle
Affiliation:
Bruker Nano GmbH
U Waldschläger
Affiliation:
Bruker Nano GmbH
H Wagenknecht
Affiliation:
Bruker Nano GmbH

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 16 , Supplement S2 , July 2010 , pp. 912 - 913
Copyright
Copyright © Microscopy Society of America 2010