Microscopy and Microanalysis: Volume 8 -

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Volume 8 - August 2002

Abstract

Layer and Defect Structures of BaF2/CaF2 Multilayers

Nanoscale Grain Boundary Dissociation: Role of Shockley Partial Dislocations

Aliovalent Dopant Distribution in Nanocrystalline Tin Dioxide Thin Films Studied by XRay Energy Dispersive Spectroscopy

Grain Boundary Segregation in Titanium Dioxide

Charging of a Structured Material during Electron Beam Exposure

Inelastic Electron Scattering Observation Using Energy Filtered Transmission Electron Microscopy for Silicon-Germanium Nanostructures Imaging.

Observation of device cross-sectional thin films prepared by FIB using JEM-2500SE, an electron microscope for nano-analysis

Nanoscale Compositional Characterization of Silicon Oxide-Nitride-Oxide Stacks

TEM Observation on Single Defect in SiC

Microanalysis of Nano-Crystalline Diamonds

Assessment of Integrated Sub-Micron Polysilicon Fuses for Low Voltage CMOS Applications

Ion Channeling Contrast Imaging of Aluminum Wire Bonds

Quantum Wire Arrays in Compositionally Modulated InAs/AlAs Superlattices

Z-Contrast Imaging of InAs Quantum Wires In GaAs/ALAs Quantum Wells

Energy Dispersive Spectrometry Calibration For The HD -2000 STEM

EFTEM Mapping of Copper - Porous SiLK Structures

Tem Study of The Microstructure of Si Thin Films Deposited by Hot Wire CVD

Screw Dislocations in GaN

Evolution of GaSb/GaAs Quantum Dot Strain Relaxation

Cracking of GaN Based III-Nitride Heterostructures Grown by MOVPE on (0001)-6H-SiC

Microscopy and Microanalysis

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Volume 8 - August 2002

Abstract