Microscopy and Microanalysis: Volume 8 -

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Volume 8 - August 2002

Abstract

Characterization and Optimization of Semiconductor Specimen Preparation for QHREM

Electrical and Structural Characterization of GaN p-n Heterostuctures by Scanning Probe Microscopy

Measurements of GaN-Based Heterostructures with Electron Beam Induced Current

A Novel Method for Direct TEM Study of Microstructure of Polysilicon Films Crystallized with and without Underlying Oxide

Applications of a Novel FIB-SIMS Instrument in SIMS Image Depth Profiling

CuPt-Type Ordering of MOCVD In0.49Al0.51P

Electron Diffraction Evidence For An Elastic XY Model Phase In Niobia-Zirconia Ceramic Alloys

Local Symmetry and Phason Fluctuations of an Ideal Al-Ni-Co Quasicrystal Studied by Atomic-resolution HAADF-STEM

Direct Observation of Icosahedral Clusters in Quasicrystals and Crystals

In Segregation and Phase Separation In Multilayer Structures

Atom Clusters in Decagonal Quasicrystals: Local Structures and Long-range Arrangements Revealed by High-resolution Electron Microscopy

In Situ Imaging of Langmuir Films Using Environmental Scanning Electron Microscopy

Imaging of Biologically Derived Anisotropic Fluids Using Environmental Scanning Electron Microscopy

Microstructures of Electrospun Polycarbonate Fibers With Solvent Mixture THF and DMF by SEM/TEM

A TEM Investigation of the Network Structure of Electron Beam Cured Epoxy Polymers

EELS characterization of highly irradiated PVC

The Affects of Lightning Strikes and High Current on Polymer Composites

Practical Methods for Transmission Electron Microscopy of Polymers.

Mesoporous, microporous and nanowired: electron microscopy of aerogel composites

The Impact of Porosity upon the Cathodoluminescence from III-V Compounds

Microscopy and Microanalysis

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Volume 8 - August 2002

Abstract