Microscopy and Microanalysis: Volume 8 -

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Volume 8 - August 2002

Abstract

Spontaneous Self-Organisation Of Gold Nanoparticles Into Ordered Two-Dimensional Arrays

Atom Probe Tomography: A Technique for Nanoscale Characterization

TEM Characterization of WS2 Nanotubes

TEM Nanostructure Manipulation Device for in Situ Study of Elastic Behavior of Nanoparticle Chain Aggregates

Low Voltage FESEM Evaluation of Nano and Microfabricated Materials

TEM Image Analysis of Self-Organized Large Gold Nanoparticle Arrays

Nanoscale Structural Manipulation of Ion Irradiated Pyrochlore

AFM Analysis of Gas Cluster Ion Impact Craters and Smoothing

Field Effects on Particle Assembly in Composite Needle Systems

Focused Ion Beam Assisted Nanofabrication – Patterned Growth of Carbon Nanotubes

Characterization of Nanoparticle Films and Structures Using Focused Ion Beam Milling and Transmission Electron Microscopy

Nanocrystalline Diamond in Ru-DOPED DLC Films

Deposition of Au Nanocrystals on TiO2 Crystallites

Composition-Size Diagrams of Supported Pt-Sn Catalysts

High Resolution Tem Observation and Eels Analysis of Carbon Nanotubes at Elevated Temperatures

Characteristics of Palladium Particles on Tin Dioxide Thin Films Studied by Transmission Electron Microscopy

Microstructural Studies of Copper Sulfide Film Growth: Influence of Humidity

Electron Microscopy Study of Fe3O4(111)/MgO(111) Polar Oxide Interface

Hrtem Characterization of Interface Between ISO-Structural Thin Solid Film and Substrate

Strain Relaxation by Misfit Dislocations in Nanoscale Epitaxial Ferroelectric BaTiO3 Films Grown on SrTiO3 Substrate

Microscopy and Microanalysis

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Volume 8 - August 2002

Abstract