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EBSD Spatial Resolution in the SEM when Analyzing Small Grains or Deformed Material

Published online by Cambridge University Press:  01 August 2002

P. Rolland
Affiliation:
Oxford Instruments Analytical, Halifax road, High Wycombe HP12 3SE UK
K Dicks
Affiliation:
Oxford Instruments Analytical, Halifax road, High Wycombe HP12 3SE UK
R. Ravel-Chapuis
Affiliation:
Jeol Europe SA rue E. Labiche, Allée de Giverny 78290 Croissy sur Seine France

Abstract

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Abstract
Copyright
Copyright © Microscopy Society of America 2002