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Development of A High Energy-resolution Soft-X-ray Spectrometer for A Transmission Electron Microscope

Published online by Cambridge University Press:  01 August 2002

M. Terauchi  and
M. Kawana
M. Terauchi
Affiliation:
Institute of Multidisciplinary Research for Advanced Materials, Tohoku University, 2-1-1 katahira, Aoba-ku, Sendai 980-8577, Japan
M. Kawana
Affiliation:
Institute of Multidisciplinary Research for Advanced Materials, Tohoku University, 2-1-1 katahira, Aoba-ku, Sendai 980-8577, Japan

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 8 , Issue S02 , August 2002 , pp. 644 - 645
Copyright
Copyright © Microscopy Society of America 2002