Microscopy and Microanalysis: Volume 19 -

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Volume 19 - August 2013

Instrumentation Sciences

A13.06 Microscopy and Microanalysis for Real World Problem Solving

Abstract

Low Voltage Silicon Drift Detector Microanalysis of the Mineral Tourmaline: Examples From the Black Hills, South Dakota

Where is the Plutonium?: Detection and Location of Plutonium-Containing Particles In Tank 18 Waste Using Scanning Electron Microscopy (SEM), Energy Dispersive Spectroscopy (EDS), Wavelength Dispersive Spectroscopy (WDS), and X-Ray Diffraction (XRD)

High-Performance DyBa2Cu3O7-x Superconducting Coated Conductors Grown by Inclined Substrate Deposition with Ic Exceeding 1000 A cm-1

Influence of Atomic Scale Compositional Gradients on Colossal Ionic Conductivity in Highly Strained YSZ/STO Heterostructures

Extensive Analysis of Structure-Property Relationships in Thin-Film Solar Cells Using Scanning Electron Microscopy in Combination with Focused Ion Beam

A13.P1 Microscopy and Microanalysis for Real World Problem Solving

Abstract

Procedure for TEM Measurement of Nanoparticles

The Importance of Scanning Electron Microscopy (SEM) and X-Ray Microanalysis (EDS) in Determination of Gunshot Residues (GSR) in Human Hands

In-Situ Analytical Electron Microscopy Study of the Lithiation of TiO2 Nanowires Used in Li-Ion Batteries

Identifying Minerals of Environmental Concern in Soils from Smelter Operations Using Multiple Microanalytical Methods

Auger Electron Spectroscopy of Carbon Diffusion Profiles in Low Temperature Carburized Stainless Steels

Cathodoluminescence-Based Quantitative Analysis of Radiation Damage in Powellite Single Crystals

Characterization of Graphite Inclusions in Cast Iron by Cathodoluminescence and X-Ray Microanalysis

Morphological Study on Electrochemical Sensor Based Polypyrrole by Scanning Electron Microscopy

Confocal and SEM Studies of Protist Parasites on Fresh Produce

Improved Specimen Preparation and SEM Imaging Reveal the Morphology of a West African Sorghum Resistant to Storage Insects

Reducing Charging Issues in Silicon on Insulator Cross Sections Under SEM

Fork Method Stabilization of Fiber Embedded Ceramics for TEM Observation

An Effective Approach to Extract Cross-Sectional Information from Top-Down SEM for 20nm & 14nm Transistor Nodes in Semiconductor Wafer-Foundries

A14.01 New Instrumentation at the Limits: Characteristics and Applications

Abstract

High Energy Resolution Monochromated EELS-STEM System

Ultra High Energy Resolution EELS Map Employing an Aberration-corrected STEM Equipped with a Monochromator

Microscopy and Microanalysis

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Volume 19 - August 2013

Instrumentation Sciences

A13.06 Microscopy and Microanalysis for Real World Problem Solving

Abstract

A13.P1 Microscopy and Microanalysis for Real World Problem Solving

Abstract

A14.01 New Instrumentation at the Limits: Characteristics and Applications

Abstract