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Ultra High Energy Resolution EELS Map Employing an Aberration-corrected STEM Equipped with a Monochromator

Published online by Cambridge University Press:  09 October 2013

M. Mukai ,
E. Okunishi ,
M. Ashino ,
K. Omoto ,
T. Fukuda ,
A. Ikeda ,
K. Somehara ,
T. Kaneyama ,
T. Saitoh  and
T. Hirayama
...Show all authors
M. Mukai
Affiliation:
E. Okunishi
Affiliation:
M. Ashino
Affiliation:
K. Omoto
Affiliation:
T. Fukuda
Affiliation:
A. Ikeda
Affiliation:
K. Somehara
Affiliation:
T. Kaneyama
Affiliation:
T. Saitoh
Affiliation:
T. Hirayama
Affiliation:
Y. Ikuhara
Affiliation:

Abstract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 19 , Issue S2: Proceedings of Microscopy & Microanalysis 2013 , August 2013 , pp. 1126 - 1127
Copyright
Copyright © Microscopy Society of America 2013