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Atom Probe Tomography: Beyond the Microscope, a Breakthrough Backdoor for Chemical, Physical and Functional Characterization at the Nanometer Scale

Published online by Cambridge University Press:  09 October 2013

F. Vurpillot ,
A. Gaillard ,
L. Arnoldi ,
A. Vella ,
L. Rigutti ,
V. Tognetti  and
B. Deconihout
F. Vurpillot
Affiliation:
A. Gaillard
Affiliation:
L. Arnoldi
Affiliation:
A. Vella
Affiliation:
L. Rigutti
Affiliation:
V. Tognetti
Affiliation:
B. Deconihout
Affiliation:

Abstract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 19 , Issue S2: Proceedings of Microscopy & Microanalysis 2013 , August 2013 , pp. 984 - 985
Copyright
Copyright © Microscopy Society of America 2013